| DTaPO: Dynamic thermal-aware performance optimization for dark silicon many-core systems MS Mohammed, AAM Al-Kubati, N Paraman, AAH Ab Rahman, ... Electronics 9 (11), 1980, 2020 | 10 | 2020 |
| Temperature-aware task scheduling for dark silicon many-core system-on-chip MS Mohammed, AK Al-Dhamari, AAH Ab Rahman, N Paraman, ... 2019 8th International Conference on Modeling Simulation and Applied …, 2019 | 10 | 2019 |
| Implementation of optimized low pass filter for ECG filtering using verilog NN Samsudin, S Isaak, N Paraman Journal of Physics: Conference Series 2312 (1), 012049, 2022 | 6 | 2022 |
| A comparative analysis of LFSR cascading for hardware efficiency and high fault coverage in BIST applications A Alamgir, AKB A’ain, N Paraman, U ullah Sheikh, I Grout 2020 IEEE 29th Asian Test Symposium (ATS), 1-5, 2020 | 6 | 2020 |
| Implementation of active learning in digital systems course I Ismail, KM Yusof, MMA Zabidi, N Paraman AIP Conference Proceedings 2433 (1), 2022 | 4 | 2022 |
| Horizontal diversity in test generation for high fault coverage A Alamgir, AKB A'ain, N Paraman, UU Sheikh, I Grout Turkish Journal of Electrical Engineering and Computer Sciences 26 (6), 3258 …, 2018 | 4 | 2018 |
| Active and Project-Based Learning Implementation in a Constructively Aligned Digital Systems Design Course I Ismail, M Mun’im Ahmad Zabidi, N Paraman, K Mohd-Yusof, ... IEEE Transactions on Education, 2023 | 3 | 2023 |
| PEW: prediction-based early dark cores wake-up using online ridge regression for many-core systems MS Mohammed, N Paraman, AAH Ab Rahman, FA Ghaleb, A Al-Dhamari, ... IEEE Access 9, 124087-124099, 2021 | 3 | 2021 |
| Impact of device parameter variation on the electrical characteristic of n-type junctionless nanowire transistor with high-k dielectrics MA Sule, M Ramakrishnan, NE Alias, N Paraman, Z Johari, A Hamzah, ... Indonesian Journal of Electrical Engineering and Informatics (IJEEI) 8 (2 …, 2020 | 3 | 2020 |
| Multiple Controlled Antirandom Testing (MCAT) for High Fault Coverage in a Black Box Environment A Alamgir, AKB A’Ain, UU Sheikh, N Paraman, MM Mokji, I Grout IEEE Access 7, 117246-117257, 2019 | 3 | 2019 |
| Rapid prototyping of NoC-based MPSoC based on dataflow modeling of real-world applications MS Mohammed, JW Tang, AAH Ab Rahman, N Paraman, MN Marsono 2018 9th IEEE Control and System Graduate Research Colloquium (ICSGRC), 217-222, 2018 | 3 | 2018 |
| Adaptive random testing with total cartesian distance for black box circuit under test A Alamgir, AK A’ain, N Paraman, UU Sheikh Indonesian Journal of Electrical Engineering and Computer Science 20 (2 …, 2020 | 1 | 2020 |
| Built-in Self-Test for Functional Register-Transfer Level using Assignment Decision Diagram NB Paraman, CY Ooi, AZB Sha’ameri, H Fujiwara IEEE Twelth Workshop on RTL and High Level Testing, 9-15, 2011 | 1 | 2011 |
| A New Class of Easily Testable Assignment Decision Diagrams N Paraman, CY Ooi, AZ Shaâ, H Fujiwara Malaysian Journal of Computer Science 23 (1), 1-17, 2010 | 1 | 2010 |
| ASIC Implementation for Multiple Scan at Register Transfer Level MLM Radzri, N Paraman, MS Rusli Journal of Physics: Conference Series 2622 (1), 012026, 2023 | | 2023 |
| Hybrid non scan with built-in self-test for fault coverage improvement A Ahmadi, N Paraman, MS Rusli, S Isaak AIP Conference Proceedings 2795 (1), 2023 | | 2023 |
| A 16-bit Brent-Kung Adder scheme for linear array photon counting circuit S Isaak, AM Ndottiwa, Y Yusof, N Paraman, A Hamzah, YH Chew AIP Conference Proceedings 2795 (1), 2023 | | 2023 |
| FPGA-Assisted Assertion-Based Verification Platform N Mohamad, CY Ooi, J Teh, N Paraman, H Hassan, N Ismail Journal of Telecommunication, Electronic and Computer Engineering (JTEC) 12 …, 2020 | | 2020 |
| Reliability of graphene as charge storage layer in floating gate flash memory MH Ahmad, NE Alias, A Hamzah, Z Johari, MSZ Abidin, N Paraman, ... Indonesian Journal of Electrical Engineering and Informatics (IJEEI) 7 (2 …, 2019 | | 2019 |
| TEST REGISTER INSERTION AT RTL BASED ON REDUCED BIST N Paraman, CY Ooi, AZ Sha'ameri, H Fujiwara Jurnal Teknologi 79 (1), 2017 | | 2017 |
