| Indexing of electron back-scatter diffraction patterns using a convolutional neural network Z Ding, E Pascal, M De Graef Acta Materialia 199, 370-382, 2020 | 43 | 2020 |
| Dictionary indexing of electron back-scatter diffraction patterns: a hands-on tutorial MA Jackson, E Pascal, M De Graef Integrating Materials and Manufacturing Innovation 8, 226-246, 2019 | 38 | 2019 |
| Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope E Pascal, S Singh, PG Callahan, B Hourahine, C Trager-Cowan, ... Ultramicroscopy 187, 98-106, 2018 | 16 | 2018 |
| Dislocation contrast in electron channelling contrast images as projections of strain-like components E Pascal, B Hourahine, G Naresh-Kumar, K Mingard, C Trager-Cowan Materials Today: Proceedings 5 (6), 14652-14661, 2018 | 16 | 2018 |
| Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, PR Edwards, ... Semiconductor Science and Technology 35 (5), 054001, 2020 | 12 | 2020 |
| Scanning electron microscopy as a flexible technique for investigating the properties of UV-emitting nitride semiconductor thin films C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, PR Edwards, ... Photonics Research 7 (11), B73-B82, 2019 | 11 | 2019 |
| Dynamical models for novel diffraction techniques in SEM E Pascal | 2 | 2019 |
| DIALS as a toolkit GE Graeme Winter, James Beilsten-Edmands, Nicholas Devenish, Markus Gerstel ... Protein Science 31 (1), 232-250, 2021 | | 2021 |
| Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, PR Edwards, ... IOP Conference Series: Materials Science and Engineering 891 (1), 012023, 2020 | | 2020 |
| Visualization of defects in nitride semiconductors by electron channeling (Conference Presentation) C Trager-Cowan, A Alasmari, W Avis, J Bruckbauer, P Edwards, ... Gallium Nitride Materials and Devices XV 11280, 1128008, 2020 | | 2020 |
| Two beam toy model for dislocation contrast in ECCI E Pascal, B Hourahine, C Trager-Cowan, M De Graef Microscopy and Microanalysis 25 (S2), 1968-1969, 2019 | | 2019 |
| Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope (vol 187, pg 98, 2018) E Pascal, S Singh, PG Callahan, B Hourahine, C Trager-Cowan, ... ULTRAMICROSCOPY 188, 101-101, 2018 | | 2018 |
| Dynamical simulations of transmission Kikuchi diffraction (TKD) patterns E Pascal, S Singh, B Hourahine, C Trager-Cowan, M De Graef Microscopy and Microanalysis 23 (S1), 540-541, 2017 | | 2017 |
| DItutorial-EMsoft-org/EMsoft GitHub Wiki Dictionary Indexing of Electron Back-Scatter Diffraction Patterns: A Hands-On Tutorial M Jackson, E Pascal, M De Graef | | |
| Theoretical model of contrast produced by threading dislocations in GaN as observed in the scanning electron microscope E Pascal, B Hourahine, NG Kumar, M Nouf-Allehiani, D Thomson, ... | | |
Ben HourahineSenior Lecturer in photonic materials, University of StrathclydeE-mail megerősítve itt: strath.ac.uk
