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Steffen Teichert
Steffen Teichert
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Titel
Zitiert von
Zitiert von
Jahr
Phase transitions in ferroelectric silicon doped hafnium oxide
TS Böscke, S Teichert, D Bräuhaus, J Müller, U Schröder, U Böttger, ...
Applied Physics Letters 99 (11), 2011
3522011
Thermal conductivity in strain symmetrized Si/Ge superlattices on Si (111)
S Chakraborty, CA Kleint, A Heinrich, CM Schneider, J Schumann, ...
Applied Physics Letters 83 (20), 4184-4186, 2003
1122003
Investigations of field-evaporated end forms in voltage-and laser-pulsed atom probe tomography
A Shariq, S Mutas, K Wedderhoff, C Klein, H Hortenbach, S Teichert, ...
Ultramicroscopy 109 (5), 472-479, 2009
812009
Impact of interface variations on J–V and C–V polarity asymmetry of MIM capacitors with amorphous and crystalline Zr (1− x) AlxO2 films
W Weinreich, R Reiche, M Lemberger, G Jegert, J Müller, L Wilde, ...
Microelectronic engineering 86 (7-9), 1826-1829, 2009
742009
Atomic Structure of a Reconstructed Interface
U Falke, A Bleloch, M Falke, S Teichert
Physical review letters 92 (11), 116103, 2004
632004
Growth of MnSi1. 7 on Si (0 0 1) by MBE
S Teichert, S Schwendler, DK Sarkar, A Mogilatenko, M Falke, G Beddies, ...
Journal of crystal growth 227, 882-887, 2001
482001
Silver nanostructures formation in porous Si/SiO2 matrix
V Sivakov, EY Kaniukov, AV Petrov, OV Korolik, AV Mazanik, ...
Journal of crystal growth 400, 21-26, 2014
432014
Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline Devices Studied With AFM-Related Techniques
M Lanza, M Porti, M Nafria, X Aymerich, G Benstetter, E Lodermeier, ...
IEEE transactions on nanotechnology 10 (2), 344-351, 2010
382010
Silver nanostructures evolution in porous SiO2/p-Si matrices for wide wavelength surface-enhanced Raman scattering applications
D Yakimchuk, E Kaniukov, V Bundyukova, L Osminkina, S Teichert, ...
MRS communications 8 (1), 95-99, 2018
352018
/Ti/Al Metal–Insulator–Metal Capacitors With Subnanometer CET Using ALD-Deposited for DRAM Applications
S Monaghan, K Cherkaoui, É O'Connor, V Djara, PK Hurley, L Oberbeck, ...
IEEE electron device letters 30 (3), 219-221, 2009
332009
Crystallization and silicon diffusion nanoscale effects on the electrical properties of Al2O3 based devices
M Lanza, M Porti, M Nafria, X Aymerich, G Benstetter, E Lodermeier, ...
Microelectronic engineering 86 (7-9), 1921-1924, 2009
312009
Real structure of the CoSi2∕ Si (001) interface studied by dedicated aberration-corrected scanning transmission electron microscopy
M Falke, U Falke, A Bleloch, S Teichert, G Beddies, HJ Hinneberg
Applied Physics Letters 86 (20), 2005
302005
Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations
T Friedrich, A Bochmann, J Dinger, S Teichert
Ultramicroscopy 184, 44-51, 2018
292018
Surfactant mediated growth of on Si(001)
S Teichert, H Hortenbach, HJ Hinneberg
Applied Physics Letters 78 (14), 1988-1990, 2001
292001
Sintering behavior, microstructure and thermoelectric properties of calcium cobaltite thick films for transversal thermoelectric multilayer generators
T Schulz, T Reimann, A Bochmann, A Vogel, B Capraro, B Mieller, ...
Journal of the European Ceramic Society 38 (4), 1600-1607, 2018
252018
Interband optical properties of higher manganese silicide thin films
M Rebien, W Henrion, H Angermann, S Teichert
Applied physics letters 81 (4), 649-651, 2002
252002
Optical interband properties of some semiconducting silicides
H Lange, W Henrion, F Fenske, T Zettler, J Schumann, S Teichert
physica status solidi (b) 194 (1), 231-240, 1996
251996
Properties of plasma-enhanced atomic layer deposition-grown tantalum carbonitride thin films
C Hossbach, S Teichert, J Thomas, L Wilde, H Wojcik, D Schmidt, ...
Journal of The Electrochemical Society 156 (11), H852, 2009
242009
Preparation and properties of MnSi1. 7 on Si (001)
S Teichert, DK Sarkar, S Schwendler, H Giesler, A Mogilatenko, M Falke, ...
Microelectronic engineering 55 (1-4), 227-232, 2001
242001
Synthesis of SrTiO3 by crystallization of SrO/TiO2 superlattices prepared by atomic layer deposition
S Riedel, J Neidhardt, S Jansen, L Wilde, J Sundqvist, E Erben, S Teichert, ...
Journal of Applied Physics 109 (9), 2011
212011
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