| The new test pattern selection method for OPC model calibration, based on the process of clustering in a hybrid space D Vengertsev, K Kim, SH Yang, S Shim, S Moon, A Shamsuarov, S Lee, ... Proc. of SPIE Vol 8522, 85221A-1, 2012 | 29 | 2012 |
| Consensus of output-coupled high-order linear multi-agent systems under deterministic and Markovian switching networks D Vengertsev, H Kim, JH Seo, H Shim International Journal of Systems Science 46 (10), 1790-1799, 2015 | 28 | 2015 |
| Consensus of output-coupled linear multi-agent systems under frequently connected network D Vengertsev, H Kim, H Shim, JH Seo 49th IEEE Conference on Decision and Control (CDC), 4559-4564, 2010 | 26 | 2010 |
| Generative learning for realistic and ground rule clean hot spot synthesis IC Graur, IP Stobert, DA Vengertsev US Patent 9,690,898, 2017 | 23 | 2017 |
| Deep Learning Architecture for Univariate Time Series Forecasting D Vengertsev Technical Report, Stanford, 2014 | 23 | 2014 |
| Semiconductor wafer inspection using care area group-specific threshold settings for detecting defects. DAV Parul Dhagat, Ananthan Raghunathan, Vikas Sachan US Patent 10,146,036, 2017 | 13* | 2017 |
| Anomaly Detection in Graph: Unsupervised Learning, Graph-based Features and Deep Architecture D Vengertsev, H Thakkar http://web.stanford.edu/class/cs224w/projects_2015 …, 2015 | 11 | 2015 |
| Method for detecting defect in pattern KH Kim, CHI Kai-Yuan, D Vengertsev, S Yang US Patent 9,542,740, 2017 | 8 | 2017 |
| Recurrent Neural Network Properties and their Verification with Monte Carlo Techniques D Vengertsev, E Sherman Proceedings of the Workshop on Artificial Intelligence Safety, 34th AAAI …, 2020 | 7 | 2020 |
| New method of detection and classification of yield-impacting EUV mask defects I Graur, D Vengertsev, A Raghunathan, I Stobert, J Rankin Photomask Technology 2015 9635, 114-120, 2015 | 6 | 2015 |
| Apparatuses and methods for determining wafer defects Y Gong, D Vengertsev, SA Eichmeyer, J Gong US Patent 11,922,613, 2024 | 5 | 2024 |
| Expansion of allowed design rule space by waiving benign geometries IC Graur, D Vengertsev US Patent 10,042,973, 2018 | 5 | 2018 |
| Test pattern selection method for OPC model calibration D Vengertsev, S Moon, A Shamsuarov, S Yang, M Jeong US Patent 8,677,288, 2014 | 4 | 2014 |
| Anomaly detection and resolution D Vengertsev, Z Hosseinimakarem, M Egorova US Patent App. 17/083,768, 2022 | 3 | 2022 |
| The effect of mask and source complexity on source mask optimization SH Yang, N Jia, SB Shim, D Vengertsev, J Choi, HK Kang, YC Kim Optical Microlithography XXVI 8683, 78-86, 2013 | 2 | 2013 |
| Apparatuses and methods for color matching and recommendations Y Hu, D Vengertsev, Z Hosseinimakarem, JD Harms US Patent App. 17/005,036, 2022 | 1 | 2022 |
| Transformer neural network in memory J Gong, SR Watson, D Vengertsev, A Parab US Patent App. 16/994,302, 2022 | 1 | 2022 |
| Confidence Preservation Property in Knowledge Distillation Abstractions D Vengertsev, E Sherman International Conference on Innovative Techniques and Applications of …, 2023 | | 2023 |
| Methods, apparatuses and computer program products for generating synthetic data M Schatz, D Vengertsev, Y Liu, IM Arbisser, Y Hao, MM Ozdal US Patent App. 17/701,102, 2023 | | 2023 |
| Bayesian network in memory D Vengertsev, SR Watson, J Gong, A Parab US Patent 11,681,906, 2023 | | 2023 |
Hyungbo ShimSeoul National University, Department of Electrical and Computer EngineeringVerified email at snu.ac.kr
