| Two-wavelength laser interferometry using superheterodyne detection R Dändliker, R Thalmann, D Prongué Optics letters 13 (5), 339-341, 1988 | 331 | 1988 |
| Ultraprecision micro-CMM using a low force 3D touch probe A Küng, F Meli, R Thalmann Measurement Science and Technology 18 (2), 319, 2007 | 259 | 2007 |
| Long-range AFM profiler used for accurate pitch measurements F Meli, R Thalmann Measurement Science and Technology 9 (7), 1087, 1998 | 193 | 1998 |
| Heterodyne and quasi-heterodyne holographic interferometry R Dandliker, R Thalmann Optical Engineering 24 (5), 824-831, 1985 | 182 | 1985 |
| Heterodyne and quasi-heterodyne holographic interferometry R Dandliker, R Thalmann Optical Engineering 24 (5), 824-831, 1985 | 182 | 1985 |
| Heterodyne and quasi-heterodyne holographic interferometry R Dandliker, R Thalmann Optical Engineering 24 (5), 824-831, 1985 | 182 | 1985 |
| Heterodyne and quasi-heterodyne holographic interferometry R Dandliker, R Thalmann Optical Engineering 24 (5), 824-831, 1985 | 182 | 1985 |
| Fringe interpolation by two-reference-beam holographic interferometry: reducing sensitivity to hologram misalignment R Dändliker, R Thalmann, JF Willemin Optics Communications 42 (5), 301-306, 1982 | 118 | 1982 |
| High precision, low force 3D touch probe for measurements on small objects F Mehli Proceedings of the 4th Euspen International Conference, Aachen, Germany …, 2003 | 62 | 2003 |
| Holographic contouring using electronic phase measurement R Thalmann, R Dandliker Optical Engineering 24 (6), 930-935, 1985 | 60 | 1985 |
| State of the art of tactile micro coordinate metrology R Thalmann, F Meli, A Küng Applied Sciences 6 (5), 150, 2016 | 54 | 2016 |
| International comparison of roundness profiles with nanometric accuracy H Haitjema, H Bosse, M Frennberg, A Sacconi, R Thalmann Metrologia 33 (1), 67, 1996 | 48 | 1996 |
| High precision pitch calibration of gratings using laser diffractometry F Meli Proceedings of the 1st International Conference on Precision Engineering and …, 1999 | 40 | 1999 |
| Optical symbolic substitution using diffraction gratings R Thalmann, G Pedrini, KJ Weible Applied optics 29 (14), 2126-2134, 1990 | 32 | 1990 |
| A primary roundness measuring machine R Thalmann, J Spiller Recent Developments in Traceable Dimensional Measurements III 5879, 140-149, 2005 | 30 | 2005 |
| CCL key comparison: calibration of gauge blocks by interferometry R Thalmann Metrologia 39 (2), 165, 2002 | 29 | 2002 |
| CCL key comparison: calibration of gauge blocks by interferometry R Thalmann Metrologia 39 (2), 165, 2002 | 29 | 2002 |
| Deformable surface spatial light modulator K Hess, R Dandliker, R Thalmann Optical Engineering 26 (5), 418-422, 1987 | 28 | 1987 |
| Strain measurement by heterodyne holographic interferometry R Thalmann, R Dändliker Applied optics 26 (10), 1964-1971, 1987 | 25 | 1987 |
| X-ray flat-panel detector geometry correction to improve dimensional computed tomography measurements M Lüthi, BA Bircher, F Meli, A Küng, R Thalmann Measurement Science and Technology 31 (3), 035002, 2019 | 24 | 2019 |
