| Effect of temperature on the Hurst and growth exponents of CdTe polycrystalline films SO Ferreira, IRB Ribeiro, J Suela, IL Menezes-Sobrinho, SC Ferreira, ... Applied physics letters 88 (24), 2006 | 35 | 2006 |
| Low temperature growth of high quality CdTe polycrystalline layers IRB Ribeiro, J Suela, JE Oliveira, SO Ferreira, P Motisuke Journal of Physics D: Applied Physics 40 (15), 4610, 2007 | 13 | 2007 |
| Evolution of crystalline domain size and epitaxial orientation of CdTe/Si (111) quantum dots J Suela, IRB Ribeiro, SO Ferreira, A Malachias, GN Fontes, LA Montoro, ... Journal of Applied Physics 107 (6), 2010 | 10 | 2010 |
| Caracterização estrutural de pontos quânticos e filmes ultrafinos de CdTe/Si (111) J Suela Universidade Federal de Viçosa, 2007 | 4 | 2007 |
| Investigation of the surface properties of CaF2 layers on (1 1 1) Si as a function of growth temperature J Suela, E Abramof, PHO Rappl, FE Freitas, H Closs, C Boschetti Journal of Physics D: Applied Physics 44 (18), 185405, 2011 | 3 | 2011 |
| Crescimento e caracterização de filmes finos de fluoretos II-A sobre substrato de silício [111] J Suela Doctoral thesis, Instituto Nacional de Pesquisas Espaciais, São José dos …, 2013 | 2 | 2013 |
| Structural Characterization of CdTe/Si (111) Quantum Dots J Suela, SO Ferreira, E Abramof, IRB Ribeiro, A Malachias AIP Conference Proceedings 1199 (1), 7-8, 2010 | 1 | 2010 |
| Study of structural and surface properties of II-a fluoride layers on (111) Si as a function of growth temperature J Suela, E Abramof, PHO Rappl, FE Freitas, C Boschetti, C Closs | | 2011 |
| Growing and morphological and structural characterization of II-a fluorides on Si (111) for posterior epitaxy of IV-VI compounds J Suela, E Abramof, PHO Rappl, H Closs, C Boschetti | | 2010 |
| Characterization of CdTe quantum dots by GID and GISAXS; Caracterizacao de pontos quanticos de CdTe por GID e GISAXS SO Ferreira, IRB Ribeiro, J Suela | | 2007 |
| Growth and structural characterization of ultra-thin Cd/Te/Si (111) layers by grazing incidence X-ray diffraction SO Ferreira, J Suela, IRB Ribeiro, MJSP Brasil, F Iikawa | | 2006 |
| GID characterization of CdTe/Si (111) quantum dots J Suela, IRB Ribeiro, SO Ferreira, A Malachias | | 2006 |
| CdTe ultra thin films and quantum dots characterized by grazing incidence X-ray diffraction J Suela, SO Ferreira, IRB Ribeiro, MJSP Brasil, F Iikawa, A Malachias | | 2006 |
| Characterization of CAF2/SI (111) thin films by synchrotron X-ray diffraction and high-resolution transmission electron microscopy J Suela, JP Gomes, PHO Eduardo Abramof Rappl, SO Ferreira, ... | | |
| Realização IFNMG–Campus Salinas-Janeiro-2012 TC Camelo, J Suela, EC Paiva | | |
| Characterization of CdTe quantum dots by GID and GISAXS SO Ferreira, IRB Ribeiro, J Suela | | |
Sukarno FerreiraUniversidade Federal de ViçosaE-mail megerősítve itt: ufv.br
