| Automatic calibration of analog and digital measuring instruments using computer vision EC Alegria, AC Serra IEEE transactions on instrumentation and measurement 49 (1), 94-99, 2000 | 178 | 2000 |
| PQ monitoring system for real-time detection and classification of disturbances in a single-phase power system T Radil, PM Ramos, FM Janeiro, AC Serra IEEE Transactions on Instrumentation and Measurement 57 (8), 1725-1733, 2008 | 143 | 2008 |
| Cross-correlation and sine-fitting techniques for high-resolution ultrasonic ranging R Queiros, FC Alegria, PS Girao, ACC Serra IEEE Transactions on Instrumentation and Measurement 59 (12), 3227-3236, 2010 | 129 | 2010 |
| A new sine-fitting algorithm for accurate amplitude and phase measurements in two channel acquisition systems PM Ramos, AC Serra Measurement 41 (2), 135-143, 2008 | 124 | 2008 |
| New spectrum leakage correction algorithm for frequency estimation of power system signals T Radil, PM Ramos, AC Serra IEEE Transactions on Instrumentation and Measurement 58 (5), 1670-1679, 2009 | 108 | 2009 |
| Simulation and experimental results of multiharmonic least-squares fitting algorithms applied to periodic signals PM Ramos, MF da Silva, RC Martins, AMC Serra IEEE Transactions on instrumentation and Measurement 55 (2), 646-651, 2006 | 99 | 2006 |
| Low frequency impedance measurement using sine-fitting PM Ramos, MF Da Silva, AC Serra Measurement 35 (1), 89-96, 2004 | 83 | 2004 |
| Combined spectral and histogram analysis for fast ADC testing AC Serra, MF da Silva, PM Ramos, RC Martins, L Michaeli, J Saliga IEEE Transactions on Instrumentation and Measurement 54 (4), 1617-1623, 2005 | 72 | 2005 |
| An FFT-based method to evaluate and compensate gain and offset errors of interleaved ADC systems JMD Pereira, PMBS Girão, AMC Serra IEEE Transactions on Instrumentation and Measurement 53 (2), 423-430, 2004 | 71 | 2004 |
| Automated ADC characterization using the histogram test stimulated by Gaussian noise RC Martins, AMC Serra IEEE Transactions on Instrumentation and Measurement 48 (2), 471-474, 1999 | 65 | 1999 |
| A one‐dimensional, self‐consistent numerical solution of Schrödinger and Poisson equations AMC Serra, HA Santos Journal of applied physics 70 (5), 2734-2738, 1991 | 64 | 1991 |
| Recent developments on impedance measurements with DSP-based ellipse-fitting algorithms PM Ramos, FM Janeiro, M Tlemçani, AC Serra IEEE Transactions on Instrumentation and Measurement 58 (5), 1680-1689, 2009 | 61 | 2009 |
| Performance analysis of an ADC histogram test using small triangular waves F Alegria, P Arpaia, AM da Cruz Serra, P Daponte IEEE Transactions on Instrumentation and Measurement 51 (4), 723-729, 2002 | 60 | 2002 |
| Computer vision applied to the automatic calibration of measuring instruments FC Alegria, AC Serra Measurement 28 (3), 185-195, 2000 | 59 | 2000 |
| Impedance measurement with sine-fitting algorithms implemented in a DSP portable device T Radil, PM Ramos, AC Serra IEEE Transactions on instrumentation and measurement 57 (1), 197-204, 2007 | 58 | 2007 |
| An ADC histogram test based on small-amplitude waves FC Alegria, P Arpaia, P Daponte, AC Serra Measurement 31 (4), 271-279, 2002 | 56 | 2002 |
| Comparison of frequency estimation algorithms for power quality assessment PM Ramos, AC Serra Measurement 42 (9), 1312-1317, 2009 | 53 | 2009 |
| A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing P Arpaia, AM da Cruz Serra, CL Monteiro IEEE Transactions on Instrumentation and Measurement 50 (4), 941-948, 2001 | 53 | 2001 |
| Automated power quality monitoring system for on-line detection and classification of disturbances V Matz, T Radil, P Ramos, AC Serra 2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007, 1-6, 2007 | 47 | 2007 |
| New methods to improve convergence of sine fitting algorithms MF da Silva, AC Serra Computer Standards & Interfaces 25 (1), 23-31, 2003 | 42 | 2003 |
