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Felipe Rosa
Felipe Rosa
Arm Cambridge
Verified email at arm.com
Title
Cited by
Cited by
Year
A fast and scalable fault injection framework to evaluate multi/many-core soft error reliability
F Rosa, F Kastensmidt, R Reis, L Ost
2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2015
542015
Using machine learning techniques to evaluate multicore soft error reliability
FR da Rosa, R Garibotti, L Ost, R Reis
IEEE Transactions on Circuits and Systems I: Regular Papers 66 (6), 2151-2164, 2019
492019
Reliability on ARM processors against soft errors through SIHFT techniques
E Chielle, F Rosa, GS Rodrigues, LA Tambara, J Tonfat, E Macchione, ...
IEEE Transactions on Nuclear Science 63 (4), 2208-2216, 2016
402016
Analyzing the impact of fault-tolerance methods in arm processors under soft errors running linux and parallelization apis
GS Rodrigues, F Rosa, ÁB de Oliveira, FL Kastensmidt, L Ost, R Reis
IEEE Transactions on Nuclear Science 64 (8), 2196-2203, 2017
382017
Instruction-driven timing CPU model for efficient embedded software development using OVP
F Rosa, L Ost, R Reis, G Sassatelli
2013 IEEE 20th International Conference on Electronics, Circuits, and …, 2013
292013
Fast energy evaluation of embedded applications for many-core systems
F Rosa, L Ost, T Raupp, F Moraes, R Reis
2014 24th International Workshop on Power and Timing Modeling, Optimization …, 2014
282014
Non-intrusive fault injection techniques for efficient soft error vulnerability analysis
V Bandeira, F Rosa, R Reis, L Ost
2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration …, 2019
182019
Analyzing the impact of using pthreads versus openmp under fault injection in arm cortex-a9 dual-core
GS Rodrigues, FL Kastensmidt, R Reis, F Rosa, L Ost
2016 16th European Conference on Radiation and Its Effects on Components and …, 2016
142016
SOFIA: An automated framework for early soft error assessment, identification, and mitigation
J Gava, V Bandeira, F Rosa, R Garibotti, R Reis, L Ost
Journal of Systems Architecture 131, 102710, 2022
132022
Evaluation of the soft error assessment consistency of a JIT‐based virtual platform simulator
G Abich, R Garibotti, V Bandeira, F da Rosa, J Gava, F Bortolon, ...
IET Computers & Digital Techniques 15 (2), 125-142, 2021
132021
Evaluation of multicore systems soft error reliability using virtual platforms
F Rosa, L Ost, R Reis, S Davidmann, L Lapides
2017 15th IEEE International New Circuits and Systems Conference (NEWCAS), 85-88, 2017
122017
Extending FreeRTOS to support dynamic and distributed mapping in multiprocessor systems
G Abich, MG Mandelli, FR Rosa, F Moraes, L Ost, R Reis
2016 IEEE International Conference on Electronics, Circuits and Systems …, 2016
122016
Extensive evaluation of programming models and ISAs impact on multicore soft error reliability
F Rosa, V Bandeira, R Reis, L Ost
Proceedings of the 55th Annual Design Automation Conference, 1-6, 2018
102018
Reliability on ARM processors against soft errors by a purely software approach
E Chielle, F Rosa, GS Rodrigues, LA Tambara, FL Kastensmidt, R Reis, ...
2015 15th European Conference on Radiation and Its Effects on Components and …, 2015
102015
Impact of dynamic voltage scaling and thermal factors on SRAM reliability
FR Rosa, RM Brum, G Wirth, F Kastensmidt, L Ost, R Reis
Microelectronics Reliability 55 (9-10), 1486-1490, 2015
102015
gem5-FIM: a flexible and scalable multicore soft error assessment framework to early reliability design space explorations
FR Da Rosa, R Reis, L Ost
2018 IEEE 9th Latin American Symposium on Circuits & Systems (LASCAS), 1-4, 2018
72018
Early evaluation of multicore systems soft error reliability using virtual platforms
FR da Rosa, R Reis, L Ost
2018 2nd Conference on PhD Research in Microelectronics and Electronics …, 2018
42018
Investigating parallel TMR approaches and thread disposability in Linux
GS Rodrigues, F Rosa, FL Kastensmidt, R Reis, L Ost
2017 24th IEEE International Conference on Electronics, Circuits and Systems …, 2017
42017
Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability
FR Rosa, RM Brum, G Wirth, L Ost, R Reis
2015 IEEE International Conference on Electronics, Circuits, and Systems …, 2015
42015
Controle seletivo do Haemonchus contortus em ovinos através do método famacha
MIB Vieira, IS Oliveira, HC Rocha, D Schuh, F Rosa, RB Moraes, ...
XXXIV Jornadas Uruguayas de Buiatría, 2006
42006
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Articles 1–20