A fast and scalable fault injection framework to evaluate multi/many-core soft error reliability F Rosa, F Kastensmidt, R Reis, L Ost 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2015 | 54 | 2015 |
Using machine learning techniques to evaluate multicore soft error reliability FR da Rosa, R Garibotti, L Ost, R Reis IEEE Transactions on Circuits and Systems I: Regular Papers 66 (6), 2151-2164, 2019 | 49 | 2019 |
Reliability on ARM processors against soft errors through SIHFT techniques E Chielle, F Rosa, GS Rodrigues, LA Tambara, J Tonfat, E Macchione, ... IEEE Transactions on Nuclear Science 63 (4), 2208-2216, 2016 | 40 | 2016 |
Analyzing the impact of fault-tolerance methods in arm processors under soft errors running linux and parallelization apis GS Rodrigues, F Rosa, ÁB de Oliveira, FL Kastensmidt, L Ost, R Reis IEEE Transactions on Nuclear Science 64 (8), 2196-2203, 2017 | 38 | 2017 |
Instruction-driven timing CPU model for efficient embedded software development using OVP F Rosa, L Ost, R Reis, G Sassatelli 2013 IEEE 20th International Conference on Electronics, Circuits, and …, 2013 | 29 | 2013 |
Fast energy evaluation of embedded applications for many-core systems F Rosa, L Ost, T Raupp, F Moraes, R Reis 2014 24th International Workshop on Power and Timing Modeling, Optimization …, 2014 | 28 | 2014 |
Non-intrusive fault injection techniques for efficient soft error vulnerability analysis V Bandeira, F Rosa, R Reis, L Ost 2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration …, 2019 | 18 | 2019 |
Analyzing the impact of using pthreads versus openmp under fault injection in arm cortex-a9 dual-core GS Rodrigues, FL Kastensmidt, R Reis, F Rosa, L Ost 2016 16th European Conference on Radiation and Its Effects on Components and …, 2016 | 14 | 2016 |
SOFIA: An automated framework for early soft error assessment, identification, and mitigation J Gava, V Bandeira, F Rosa, R Garibotti, R Reis, L Ost Journal of Systems Architecture 131, 102710, 2022 | 13 | 2022 |
Evaluation of the soft error assessment consistency of a JIT‐based virtual platform simulator G Abich, R Garibotti, V Bandeira, F da Rosa, J Gava, F Bortolon, ... IET Computers & Digital Techniques 15 (2), 125-142, 2021 | 13 | 2021 |
Evaluation of multicore systems soft error reliability using virtual platforms F Rosa, L Ost, R Reis, S Davidmann, L Lapides 2017 15th IEEE International New Circuits and Systems Conference (NEWCAS), 85-88, 2017 | 12 | 2017 |
Extending FreeRTOS to support dynamic and distributed mapping in multiprocessor systems G Abich, MG Mandelli, FR Rosa, F Moraes, L Ost, R Reis 2016 IEEE International Conference on Electronics, Circuits and Systems …, 2016 | 12 | 2016 |
Extensive evaluation of programming models and ISAs impact on multicore soft error reliability F Rosa, V Bandeira, R Reis, L Ost Proceedings of the 55th Annual Design Automation Conference, 1-6, 2018 | 10 | 2018 |
Reliability on ARM processors against soft errors by a purely software approach E Chielle, F Rosa, GS Rodrigues, LA Tambara, FL Kastensmidt, R Reis, ... 2015 15th European Conference on Radiation and Its Effects on Components and …, 2015 | 10 | 2015 |
Impact of dynamic voltage scaling and thermal factors on SRAM reliability FR Rosa, RM Brum, G Wirth, F Kastensmidt, L Ost, R Reis Microelectronics Reliability 55 (9-10), 1486-1490, 2015 | 10 | 2015 |
gem5-FIM: a flexible and scalable multicore soft error assessment framework to early reliability design space explorations FR Da Rosa, R Reis, L Ost 2018 IEEE 9th Latin American Symposium on Circuits & Systems (LASCAS), 1-4, 2018 | 7 | 2018 |
Early evaluation of multicore systems soft error reliability using virtual platforms FR da Rosa, R Reis, L Ost 2018 2nd Conference on PhD Research in Microelectronics and Electronics …, 2018 | 4 | 2018 |
Investigating parallel TMR approaches and thread disposability in Linux GS Rodrigues, F Rosa, FL Kastensmidt, R Reis, L Ost 2017 24th IEEE International Conference on Electronics, Circuits and Systems …, 2017 | 4 | 2017 |
Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability FR Rosa, RM Brum, G Wirth, L Ost, R Reis 2015 IEEE International Conference on Electronics, Circuits, and Systems …, 2015 | 4 | 2015 |
Controle seletivo do Haemonchus contortus em ovinos através do método famacha MIB Vieira, IS Oliveira, HC Rocha, D Schuh, F Rosa, RB Moraes, ... XXXIV Jornadas Uruguayas de Buiatría, 2006 | 4 | 2006 |