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Jean-Max Dutertre
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Electromagnetic transient faults injection on a hardware and a software implementations of AES
A Dehbaoui, JM Dutertre, B Robisson, A Tria
2012 Workshop on Fault Diagnosis and Tolerance in Cryptography, 7-15, 2012
2852012
When clocks fail: On critical paths and clock faults
M Agoyan, JM Dutertre, D Naccache, B Robisson, A Tria
International conference on smart card research and advanced applications …, 2010
2522010
Fault model analysis of laser-induced faults in sram memory cells
C Roscian, A Sarafianos, JM Dutertre, A Tria
2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 89-98, 2013
1312013
How to flip a bit?
M Agoyan, JM Dutertre, AP Mirbaha, D Naccache, AL Ribotta, A Tria
2010 IEEE 16th International On-Line Testing Symposium, 235-239, 2010
1152010
Efficiency of a glitch detector against electromagnetic fault injection
L Zussa, A Dehbaoui, K Tobich, JM Dutertre, P Maurine, ...
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
1032014
Injection of transient faults using electromagnetic pulses-Practical results on a cryptographic system-.
A Dehbaoui, JM Dutertre, B Robisson, P Orsatelli, P Maurine, A Tria
IACR Cryptology EPrint Archive 2012, 123, 2012
912012
Frontside laser fault injection on cryptosystems-Application to the AES'last round
C Roscian, JM Dutertre, A Tria
2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013
892013
Power supply glitch induced faults on FPGA: An in-depth analysis of the injection mechanism
L Zussa, JM Dutertre, J Clediere, A Tria
2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 110-115, 2013
832013
A side-channel and fault-attack resistant AES circuit working on duplicated complemented values
M Doulcier-Verdier, JM Dutertre, J Fournier, JB Rigaud, B Robisson, ...
2011 IEEE International Solid-State Circuits Conference, 274-276, 2011
802011
Investigation of timing constraints violation as a fault injection means
L Zussa, JM Dutertre, J Clédiere, B Robisson, A Tria
27th Conference on Design of Circuits and Integrated Systems (DCIS), Avignon …, 2012
722012
Laser-induced single-bit faults in flash memory: Instructions corruption on a 32-bit microcontroller
B Colombier, A Menu, JM Dutertre, PA Moëllic, JB Rigaud, JL Danger
2019 IEEE International Symposium on Hardware Oriented Security and Trust …, 2019
682019
A DFA on AES based on the entropy of error distributions
R Lashermes, G Reymond, JM Dutertre, J Fournier, B Robisson, A Tria
2012 workshop on fault diagnosis and tolerance in cryptography, 34-43, 2012
622012
Evidence of a larger EM-induced fault model
S Ordas, L Guillaume-Sage, K Tobich, JM Dutertre, P Maurine
Smart Card Research and Advanced Applications: 13th International Conference …, 2015
582015
Electromagnetic glitch on the AES round counter
A Dehbaoui, AP Mirbaha, N Moro, JM Dutertre, A Tria
International Workshop on Constructive Side-Channel Analysis and Secure …, 2013
562013
Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model
JM Dutertre, V Beroulle, P Candelier, S De Castro, LB Faber, ML Flottes, ...
2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), 1-6, 2018
492018
Single-bit DFA using multiple-byte laser fault injection
M Agoyan, JM Dutertre, AP Mirbaha, D Naccache, AL Ribotta, A Tria
2010 IEEE International Conference on Technologies for Homeland Security …, 2010
482010
High-speed ring oscillator based sensors for remote side-channel attacks on FPGAs
J Gravellier, JM Dutertre, Y Teglia, P Loubet-Moundi
2019 International conference on ReConFigurable computing and FPGAs …, 2019
452019
Remote side-channel attacks on heterogeneous SoC
J Gravellier, JM Dutertre, Y Teglia, PL Moundi, F Olivier
Smart Card Research and Advanced Applications: 18th International Conference …, 2020
442020
Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology
A Sarafianos, O Gagliano, V Serradeil, M Lisart, JM Dutertre, A Tria
2013 IEEE International Reliability Physics Symposium (IRPS), 5B. 5.1-5B. 5.9, 2013
422013
Analysis of the fault injection mechanism related to negative and positive power supply glitches using an on-chip voltmeter
L Zussa, JM Dutertre, J Clediere, B Robisson
2014 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2014
402014
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