Thomas Nirmaier
Thomas Nirmaier
E-mail megerősítve itt: infineon.com
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Hivatkozott rá
Hivatkozott rá
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Very fast wave-front measurements at the human eye with a custom CMOS-based Hartmann-Shack sensor
T Nirmaier, G Pudasaini, J Bille
Optics Express 11 (21), 2704-2716, 2003
652003
Sensitive NO2 detection with surface acoustic wave devices using a cyclic measuring technique
C Müller, T Nirmaier, A Rügemer, MV Schickfus
Sensors and Actuators B: Chemical 68 (1-3), 69-73, 2000
342000
Mission profile aware robustness assessment of automotive power devices
T Nirmaier, A Burger, M Harrant, A Viehl, O Bringmann, W Rosenstiel, ...
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
172014
Fast Hartmann-Shack wavefront sensors manufactured in standard CMOS technology
DWL Monteiro, T Nirmaier, GV Vdovin, AJP Theuwissen
IEEE Sensors Journal 5 (5), 976-982, 2005
172005
High-speed CMOS wavefront sensor with resistive-ring networks of winner-take-all circuits
T Nirmaier, CA Diez, JF Bille
IEEE journal of solid-state circuits 40 (11), 2315-2322, 2005
132005
Configurable load emulation using FPGA and power amplifiers for automotive power ICs
M Harrant, T Nirmaier, C Grimm, G Pelz
Models, Methods, and Tools for Complex Chip Design, 109-126, 2014
112014
Measuring and improving the robustness of automotive smart power microelectronics
T Nirmaier, VM zu Bexten, M Tristl, M Harrant, M Kunze, M Rafaila, J Lau, ...
2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), 872-873, 2012
82012
Fully automated semiconductor operating condition testing
C Hong, E Liau, W Spirkl, T Nirmaier
2006 IEEE International Test Conference, 1-9, 2006
82006
Extending Constrained Random Verification to mixed-signal Automotive Power Devices using a non-stationary Markov Process
T Nirmaier, M Harrant, G Pelz
Test Conference, ITC'11, International Workshop on Silicon Debug & Diagnosis …, 2011
72011
Robustness Metrics for Automotive Power Microelectronics
T Nirmaier, J Kirscher, R Monica, H Manuel, G Pelz
Design Automation and Test Conference, Grenoble, RIIF Workshop, 2013
62013
Monte Carlo based post-silicon verification considering automotive application variances
M Harrant, T Nirmaier, J Kirscher, C Grimm, G Pelz
Proceedings of the 2013 9th Conference on Ph. D. Research in …, 2013
42013
Hartmann-Shack sensor ASIC’s for real-time adaptive optics in biomedical physics
T Nirmaier, D Droste, J Bille
Proc. 6th World multiconference on systemics, cybernetics and informatics 13 …, 2002
42002
Emulation-based robustness assessment for automotive smart-power ICs
M Harrant, T Nirmaier, J Kirscher, C Grimm, G Pelz
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
32014
Methods and apparatuses for generating a random sequence of commands for a semiconductor device
T Nirmaier, W Spirkl
US Patent 7,865,795, 2011
32011
Mixed-Signal Assertions versus Machine-Learning as Fault Detection Method in post-silicon verification
Thomas Nirmaier,Manuel Harrant, Benedikt Grünewald, Björn Eversmann, Georg Pelz
Testmethoden und Zuverlässigkeit von Schaltungen und Systemen (TuZ 2019 …, 2019
2*2019
Method and device for determining test sets of operating parameter values for an electronic component
G Pelz, T Nirmaier
US Patent 8,868,371, 2014
22014
Efficient high-speed interface verification and fault analysis
T Nirmaier, JT Zaguirre, ELC Hong, W Spirkl, A Rettenberger, ...
2008 IEEE International Test Conference, 1-9, 2008
22008
Apparatus and method for generating a high-frequency signal
W Nikutta, T Nirmaier
US Patent App. 11/027,918, 2006
22006
CMOS technology in Hartmann-Shack wavefront sensing
DW de Lima Monteiro, T Nirmaier
Adaptive Optics for Industry and Medicine, 163-175, 2005
22005
Load driver circuit including load model parameter estimation
M Harrant, T Nirmaier, J Kirscher, G Pelz
US Patent 9,859,739, 2018
12018
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