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Márton C. Bein
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The role of defects in chemical sensing properties of carbon nanotube films
ZE Horváth, AA Koós, K Kertész, G Molnár, G Vértesy, MC Bein, T Frigyes, ...
Applied Physics A 93, 495-504, 2008
272008
Comparison of two alternative junction temperature setting methods aimed for thermal and optical testing of high power LEDs
MC Bein, J Hegedüs, G Hantos, L Gaál, G Farkas, M Rencz, A Poppe
2017 23rd International Workshop on Thermal Investigations of ICs and …, 2017
202017
Thermal-electronic integrated logic
J Mizsei, J Lappalainen, MC Bein
19th International Workshop on Thermal Investigations of ICs and Systems …, 2013
152013
Complex superstructure patterns near defect sites of carbon nanotubes and graphite
L Tapasztó, P Nemes-Incze, Z Osváth, MC Bein, A Darabont, LP Biró
Physica E: Low-dimensional Systems and Nanostructures 40 (7), 2263-2267, 2008
152008
Measurement issues in LED characterization for Delphi4LED style combined electrical-optical-thermal LED modeling
G Hantos, J Hegedüs, MC Bein, L Gaál, G Farkas, Z Sárkány, S Ress, ...
2017 IEEE 19th Electronics Packaging Technology Conference (EPTC), 1-7, 2017
142017
Multi domain modelling of power LEDs based on measured isothermal and transient IVL characteristics
G Farkas, MC Bein, L Gaál
2016 22nd International Workshop on Thermal Investigations of ICs and …, 2016
132016
LED Characterization within the Delphi4LED Project
G Farkas, L Gaál, M Bein, A Poppe, S Ress, M Rencz
2018 17th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2018
122018
The phonsistor–a novel vo2 based nanoscale thermal-electronic device and its application in thermal-electronic logic circuits (telc)
J Mizsei, MC Bein, J Lappalainen, L Juhász, B Plesz
Materials Today: Proceedings 2 (8), 4272-4279, 2015
122015
Focused ion beam based sputtering yield measurements on ZnO and Mo thin films
E Horváth, A Németh, AA Koós, MC Bein, AL Tóth, ZE Horváth, LP Biró, ...
Superlattices and Microstructures 42 (1-6), 392-397, 2007
122007
Lifetime estimation of power electronics modules considering the target application
A Szel, Z Sarkany, M Bein, R Bornoff, A Vass-Varnai, M Rencz
2015 31st Thermal Measurement, Modeling & Management Symposium (SEMI-THERM …, 2015
112015
Thermal-electronic logic circuits: Scaling down
J Mizsei, MC Bein, J Lappalainen, L Juhász
Microelectronics Journal 46 (12), 1175-1178, 2015
82015
Mission profile driven component design for adjusting product lifetime on system level
A Szel, Z Sarkany, M Bein, R Bornoff, A Vass-Varnai, M Rencz
2015 International Conference on Electronics Packaging and iMAPS All Asia …, 2015
42015
Contracting current paths in vanadium dioxide thin films
MC Bein, J Mizsei
2011 17th International Workshop on Thermal Investigations of ICs and …, 2011
42011
Thermal-electronic devices and thermal-electronic logic circuits (TELC)
J Mizsei, MC Bein, L Juhász, É Jelinek
2015 38th International Spring Seminar on Electronics Technology (ISSE), 61-65, 2015
32015
Measurement-Based Multi-Domain Modeling of LEDs for “Industry 4.0”
MC Bein, R Bornoff, G Farkas, L Gaal, A Poppe, M Rencz
2019 18th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2019
22019
Thermal-electronic circuits: Basics, simulations, experiments
J Mizsei, MC Bein, J Lappalainen, L Juhász
2015 21st International Workshop on Thermal Investigations of ICs and …, 2015
22015
Simulations on vanadium dioxide thin film as thermographic material
MC Bein, J Mizsei
18th International Workshop on THERMal INvestigation of ICs and Systems, 1-4, 2012
12012
Scaling of thermal-electronic logic circuits
J Mizsei, MC Bein, J Lappalainen, L Juhász
20th International Workshop on Thermal Investigations of ICs and Systems, 1-3, 2014
2014
Author Index
M Avcu, T Baba, PE Bagnoli, JH Bahk, J Bai, R Baillot, A Bartolini, ...
Thermal Investigations of ICs and Systems (THERMINIC), 2012 18th …, 2012
2012
THERMINIC 2017 authors' index
LP Aigouy, NP Ait-Mani, AS Aladov, SS Alimohammadi, FS Alzina, ...
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