| Many-beam dynamical simulation of electron backscatter diffraction patterns A Winkelmann, C Trager-Cowan, F Sweeney, AP Day, P Parbrook Ultramicroscopy 107 (4), 414-421, 2007 | 242 | 2007 |
| Compositional pulling effects in In x Ga 1-x N/G a N layers: A combined depth-resolved cathodoluminescence and Rutherford backscattering/channeling study S Pereira, MR Correia, E Pereira, KP O’donnell, C Trager-Cowan, ... Physical Review B 64 (20), 205311, 2001 | 232 | 2001 |
| Structural and optical properties of InGaN/GaN layers close to the critical layer thickness S Pereira, MR Correia, E Pereira, C Trager-Cowan, F Sweeney, ... Applied physics letters 81 (7), 1207-1209, 2002 | 126 | 2002 |
| Electron backscatter diffraction and electron channeling contrast imaging of tilt and dislocations in nitride thin films C Trager-Cowan, F Sweeney, PW Trimby, AP Day, A Gholinia, ... Physical Review B 75 (8), 085301, 2007 | 116 | 2007 |
| Rapid nondestructive analysis of threading dislocations in wurtzite materials using the scanning electron microscope G Naresh-Kumar, B Hourahine, PR Edwards, AP Day, A Winkelmann, ... Physical review letters 108 (13), 135503, 2012 | 85 | 2012 |
| Temperature dependence of the lifetime of Cr3+ luminescence in garnet crystals I M Yamaga, B Henderson, KP O'Donnell, CT Cowan, A Marshall Applied Physics B 50 (5), 425-431, 1990 | 82 | 1990 |
| Far-infrared spectroscopic identification of D-states in GaAs, InP and InSb SP Najda, CJ Armistead, C Trager, RA Stradling Semiconductor science and technology 4 (6), 439, 1989 | 60 | 1989 |
| Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns S Vespucci, A Winkelmann, G Naresh-Kumar, KP Mingard, D Maneuski, ... Physical Review B 92 (20), 205301, 2015 | 58 | 2015 |
| Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN … A Vilalta-Clemente, G Naresh-Kumar, M Nouf-Allehiani, P Gamarra, ... Acta Materialia 125, 125-135, 2017 | 49 | 2017 |
| The dependence of the optical energies on InGaN composition KP O'Donnell, RW Martin, C Trager-Cowan, ME White, K Esona, ... Materials Science and Engineering: B 82 (1), 194-196, 2001 | 47 | 2001 |
| Morphology of luminescent GaN films grown by molecular beam epitaxy C Trager‐Cowan, KP O’Donnell, SE Hooper, CT Foxon Applied physics letters 68 (3), 355-357, 1996 | 47 | 1996 |
| Band alignments in Zn (Cd) S (Se) strained layer superlattices C Trager-Cowan, PJ Parbrook, B Henderson, KP O'Donnell Semiconductor science and technology 7 (4), 536, 1992 | 45 | 1992 |
| Luminescence from porous silicon X Chen, D Uttamchandani, C Trager-Cowan, KP O'donnell Semiconductor science and technology 8 (1), 92, 1993 | 42 | 1993 |
| Imaging of cathodoluminescence zoning in calcite by scanning electron microscopy and hyperspectral mapping MR Lee, RW Martin, C Trager-Cowan, PR Edwards Journal of Sedimentary Research 75 (2), 313-322, 2005 | 38 | 2005 |
| Photoluminescence of wide bandgap II–VI superlattices KP O'Donnell, PJ Parbrook, B Henderson, C Trager-Cowan, X Chen, ... Journal of crystal growth 101 (1-4), 554-558, 1990 | 38 | 1990 |
| Coincident Electron Channeling and Cathodoluminescence Studies of Threading Dislocations in GaN G Naresh-Kumar, J Bruckbauer, PR Edwards, S Kraeusel, B Hourahine, ... Microscopy and Microanalysis 20 (01), 55-60, 2014 | 35 | 2014 |
| The optical properties of wide bandgap binary II–VI superlattices KP O'Donnell, PJ Parbrook, F Yang, X Chen, DJ Irvine, C Trager-Cowan, ... Journal of Crystal Growth 117 (1-4), 497-500, 1992 | 34 | 1992 |
| Growth and optical properties of GaN grown by MBE on novel lattice-matched oxide substrates JFH Nicholls, H Gallagher, B Henderson, C Trager-Cowan, PG Middleton, ... MRS Proceedings 395, 535, 1995 | 33 | 1995 |
| Improving EBSD precision by orientation refinement with full pattern matching A Winkelmann, BM Jablon, VS Tong, C TRAGER‐COWAN, KP Mingard Journal of Microscopy 277 (2), 79-92, 2020 | 32 | 2020 |
| Electron channelling contrast imaging for III-nitride thin film structures G Naresh-Kumar, D Thomson, M Nouf-Allehiani, J Bruckbauer, ... Materials Science in Semiconductor Processing 47, 44-50, 2016 | 29 | 2016 |
Robert MartinProfessor of Physics, Strathclyde UniversityE-mail megerősítve itt: strath.ac.uk
