Spectroscopic ellipsometry analyses of sputtered nanostructures S Charvet, R Madelon, F Gourbilleau, R Rizk
Journal of Applied Physics 85 (8), 4032-4039, 1999
77 1999 Nanocrystalline silicon thin films prepared by radiofrequency magnetron sputtering C Goncalves, S Charvet, A Zeinert, M Clin, K Zellama
Thin Solid Films 403, 91-96, 2002
72 2002 Elaboration and electrochemical characterization of nitrogenated amorphous carbon films A Lagrini, C Deslouis, H Cachet, M Benlahsen, S Charvet
Electrochemistry communications 6 (3), 245-248, 2004
51 2004 Opto-electronic properties of bismuth oxide films presenting different crystallographic phases CL Gomez, O Depablos-Rivera, P Silva-Bermudez, S Muhl, A Zeinert, ...
Thin Solid Films 578, 103-112, 2015
49 2015 Correlation between plasma parameters, microstructure and optical properties of sputtering magnetron CNx films M Lejeune, O Durand-Drouhin, S Charvet, A Grosman, C Ortega, ...
Thin Solid Films 444 (1-2), 1-8, 2003
43 2003 Improvement and characterization of the electrochemical reactivity of amorphous carbon nitride electrodes M Benlahsen, H Cachet, S Charvet, C Debiemme-Chouvy, C Deslouis, ...
Electrochemistry communications 7 (5), 496-499, 2005
37 2005 Structural, ellipsometry and photoluminescence spectroscopy studies of silicon nanograins embedded in a silica matrix S Charvet, R Madelon, R Rizk
Solid-State Electronics 45 (8), 1505-1511, 2001
34 2001 Ellipsometric spectroscopy study of photoluminescent Si/SiO2 systems obtained by magnetron co-sputtering S Charvet, R Madelon, F Gourbilleau, R Rizk
Journal of luminescence 80 (1-4), 257-261, 1998
34 1998 Substrate temperature dependence of the photoluminescence efficiency of co-sputtered Si/SiO2 layers S Charvet, R Madelon, R Rizk, B Garrido, O Gonzalez-Varona, M Lopez, ...
Journal of luminescence 80 (1-4), 241-245, 1998
33 1998 Study of efficiencies CdTe/CdS photovoltaic solar cell according to electrical properties by scaps simulation SM Seck, EN Ndiaye, M Fall, S Charvet
Natural Resources 11 (4), 147-155, 2020
32 2020 Effect of the RF power and deposition temperature on the electrical and vibrational properties of carbon nitride films G Lazar, M Clin, S Charvet, M Therasse, C Godet, K Zellama
Diamond and related materials 12 (2), 201-207, 2003
27 2003 Stoichiometry and infrared absorption of amorphous carbon nitride films B Bouchet-Fabre, C Godet, M Lacerda, S Charvet, K Zellama, D Ballutaud
Journal of applied physics 95 (7), 3427-3436, 2004
24 2004 Microstructure and electronic investigations of carbon nitride films deposited by RF magnetron sputtering A Lagrini, S Charvet, M Benlahsen, C Debiemme-Chouvy, C Deslouis, ...
Thin Solid Films 482 (1-2), 41-44, 2005
23 2005 On the relation between microstructure and electrochemical reactivity of sputtered amorphous carbon nitride electrodes A Lagrini, S Charvet, M Benlahsen, H Cachet, C Deslouis
Diamond and related materials 16 (4-7), 1378-1382, 2007
22 2007 Deposition of nanocryctalline silicon thin films: Effect of total pressure and substrate temperature R Baghdad, D Benlakehal, X Portier, K Zellama, S Charvet, JD Sib, M Clin, ...
Thin Solid Films 516 (12), 3965-3970, 2008
21 2008 Optical behavior of reactive sputtered carbon nitride films during annealing M Lejeune, S Charvet, A Zeinert, M Benlahsen
Journal of Applied Physics 103 (1), 2008
20 2008 On the induced microstructure changes of the amorphous carbon nitride films during annealing M Lejeune, O Durand-Drouhin, S Charvet, A Zeinert, M Benlahsen
Journal of Applied Physics 101 (12), 2007
18 2007 Ellipsometric and Raman spectroscopic study of nanocrystalline silicon thin films prepared by a rf magnetron sputtering technique Y Bouizem, C Abbes, JD Sib, D Benlakehal, R Baghdad, L Chahed, ...
Journal of Physics: Condensed Matter 20 (44), 445221, 2008
17 2008 Hydrogen related crystallization in intrinsic hydrogenated amorphous silicon films prepared by reactive radiofrequency magnetron sputtering at low temperature D Senouci, R Baghdad, A Belfedal, L Chahed, X Portier, S Charvet, ...
Thin Solid Films 522, 186-192, 2012
16 2012 The effect of the terminating bonds on the electronic properties of sputtered carbon nitride thin films F Alibart, S Peponas, S Charvet, M Benlahsen
Thin Solid Films 519 (10), 3430-3436, 2011
11 2011