| A novel hardware logic encryption technique for thwarting illegal overproduction and hardware trojans S Dupuis, PS Ba, G Di Natale, ML Flottes, B Rouzeyre 2014 IEEE 20th International On-Line Testing Symposium (IOLTS), 49-54, 2014 | 281 | 2014 |
| Scan Design and Secure Chip. D Hély, ML Flottes, F Bancel, B Rouzeyre, N Berard, M Renovell IOLTS 4, 219-224, 2004 | 204 | 2004 |
| Test control for secure scan designs D Hely, F Bancel, ML Flottes, B Rouzeyre European Test Symposium (ETS'05), 190-195, 2005 | 121 | 2005 |
| Test versus security: Past and present J Da Rolt, A Das, G Di Natale, ML Flottes, B Rouzeyre, I Verbauwhede IEEE Transactions on Emerging topics in Computing 2 (1), 50-62, 2014 | 115 | 2014 |
| Are advanced DfT structures sufficient for preventing scan-attacks? J Da Rolt, G Di Natale, ML Flottes, B Rouzeyre 2012 IEEE 30th VLSI Test Symposium (VTS), 246-251, 2012 | 84 | 2012 |
| New security threats against chips containing scan chain structures J Da Rolt, G Di Natale, ML Flottes, B Rouzeyre 2011 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2011 | 84 | 2011 |
| A novel differential scan attack on advanced DFT structures JD Rolt, GD Natale, ML Flottes, B Rouzeyre ACM Transactions on Design Automation of Electronic Systems (TODAES) 18 (4 …, 2013 | 76 | 2013 |
| Scan attacks and countermeasures in presence of scan response compactors J DaRolt, G Di Natale, ML Flottes, B Rouzeyre 2011 Sixteenth IEEE European Test Symposium, 19-24, 2011 | 67 | 2011 |
| Preventing scan attacks on secure circuits through scan chain encryption M Da Silva, ML Flottes, G Di Natale, B Rouzeyre IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018 | 63 | 2018 |
| Logic locking: A survey of proposed methods and evaluation metrics S Dupuis, ML Flottes Journal of Electronic Testing 35, 273-291, 2019 | 62 | 2019 |
| Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model JM Dutertre, V Beroulle, P Candelier, S De Castro, LB Faber, ML Flottes, ... 2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), 1-6, 2018 | 62 | 2018 |
| Secure scan techniques: a comparison D Hely, F Bancel, ML Flottes, B Rouzeyre 12th IEEE International On-Line Testing Symposium (IOLTS'06), 6 pp., 2006 | 57 | 2006 |
| Secure JTAG implementation using Schnorr protocol A Das, J Da Rolt, S Ghosh, S Seys, S Dupuis, G Di Natale, ML Flottes, ... Journal of Electronic Testing 29, 193-209, 2013 | 55 | 2013 |
| A reliable architecture for parallel implementations of the advanced encryption standard G Di Natale, M Doulcier, ML Flottes, B Rouzeyre Journal of Electronic Testing 25 (4), 269-278, 2009 | 55 | 2009 |
| Securing scan control in crypto chips D Hély, F Bancel, ML Flottes, B Rouzeyre Journal of Electronic Testing 23 (5), 457-464, 2007 | 55 | 2007 |
| Self-test techniques for crypto-devices G Di Natale, M Doulcier, ML Flottes, B Rouzeyre IEEE transactions on very large scale integration (VLSI) systems 18 (2), 329-333, 2009 | 51 | 2009 |
| Protection against hardware trojans with logic testing: Proposed solutions and challenges ahead S Dupuis, ML Flottes, G Di Natale, B Rouzeyre IEEE Design & Test 35 (2), 73-90, 2017 | 48 | 2017 |
| Analyzing testability from behavioral to RT level ML Flottes, R Pires, B Rouzeyre Proceedings European Design and Test Conference. ED & TC 97, 158-165, 1997 | 43 | 1997 |
| A new scan attack on rsa in presence of industrial countermeasures J Da Rolt, A Das, G Di Natale, ML Flottes, B Rouzeyre, I Verbauwhede Constructive Side-Channel Analysis and Secure Design: Third International …, 2012 | 41 | 2012 |
| A survey on security threats and countermeasures in IEEE test standards E Valea, M Da Silva, G Di Natale, ML Flottes, B Rouzeyre IEEE Design & Test 36 (3), 95-116, 2019 | 39 | 2019 |
Giorgio Di NataleCNRS - TIMAVerified email at univ-grenoble-alpes.fr
