A novel hardware logic encryption technique for thwarting illegal overproduction and hardware trojans S Dupuis, PS Ba, G Di Natale, ML Flottes, B Rouzeyre 2014 IEEE 20th International On-Line Testing Symposium (IOLTS), 49-54, 2014 | 257 | 2014 |
Scan design and secure chip [secure IC testing] D Hély, ML Flottes, F Bancel, B Rouzeyre, N Berard, M Renovell IOLTS: International On-Line Testing Symposium, 219-224, 2004 | 197 | 2004 |
Test control for secure scan designs D Hely, F Bancel, ML Flottes, B Rouzeyre European Test Symposium (ETS'05), 190-195, 2005 | 112 | 2005 |
Test versus security: Past and present J Da Rolt, A Das, G Di Natale, ML Flottes, B Rouzeyre, I Verbauwhede IEEE Transactions on Emerging topics in Computing 2 (1), 50-62, 2014 | 98 | 2014 |
Are advanced DfT structures sufficient for preventing scan-attacks? J Da Rolt, G Di Natale, ML Flottes, B Rouzeyre 2012 IEEE 30th VLSI Test Symposium (VTS), 246-251, 2012 | 76 | 2012 |
New security threats against chips containing scan chain structures J Da Rolt, G Di Natale, ML Flottes, B Rouzeyre 2011 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2011 | 76 | 2011 |
A novel differential scan attack on advanced DFT structures JD Rolt, GD Natale, ML Flottes, B Rouzeyre ACM Transactions on Design Automation of Electronic Systems (TODAES) 18 (4 …, 2013 | 62 | 2013 |
Scan attacks and countermeasures in presence of scan response compactors J DaRolt, G Di Natale, ML Flottes, B Rouzeyre 2011 Sixteenth IEEE European Test Symposium, 19-24, 2011 | 62 | 2011 |
A reliable architecture for parallel implementations of the advanced encryption standard G Di Natale, M Doulcier, ML Flottes, B Rouzeyre Journal of Electronic Testing 25 (4-5), 269-278, 2009 | 55 | 2009 |
Secure scan techniques: a comparison D Hely, F Bancel, ML Flottes, B Rouzeyre 12th IEEE International On-Line Testing Symposium (IOLTS'06), 6 pp., 2006 | 55 | 2006 |
Securing scan control in crypto chips D Hély, F Bancel, ML Flottes, B Rouzeyre Journal of Electronic Testing 23 (5), 457-464, 2007 | 50 | 2007 |
Secure JTAG implementation using Schnorr protocol A Das, J Da Rolt, S Ghosh, S Seys, S Dupuis, G Di Natale, ML Flottes, ... Journal of Electronic Testing 29, 193-209, 2013 | 47 | 2013 |
Self-test techniques for crypto-devices G Di Natale, M Doulcier, ML Flottes, B Rouzeyre IEEE transactions on very large scale integration (VLSI) systems 18 (2), 329-333, 2009 | 47 | 2009 |
Preventing scan attacks on secure circuits through scan chain encryption M Da Silva, ML Flottes, G Di Natale, B Rouzeyre IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018 | 46 | 2018 |
Analyzing testability from behavioral to RT level ML Flottes, R Pires, B Rouzeyre Proceedings European Design and Test Conference. ED & TC 97, 158-165, 1997 | 44 | 1997 |
Logic locking: A survey of proposed methods and evaluation metrics S Dupuis, ML Flottes Journal of Electronic Testing 35, 273-291, 2019 | 40 | 2019 |
New testing procedure for finding insertion sites of stealthy hardware Trojans S Dupuis, PS Ba, ML Flottes, G Di Natale, B Rouzeyre 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 776-781, 2015 | 38 | 2015 |
A new scan attack on rsa in presence of industrial countermeasures J Da Rolt, A Das, G Di Natale, ML Flottes, B Rouzeyre, I Verbauwhede Constructive Side-Channel Analysis and Secure Design: Third International …, 2012 | 38 | 2012 |
AES-based BIST: self-test, test pattern generation and signature analysis M Doulcier, ML Flottes, B Rouzeyre 4th IEEE International Symposium on Electronic Design, Test and Applications …, 2008 | 38 | 2008 |
Protection against hardware trojans with logic testing: Proposed solutions and challenges ahead S Dupuis, ML Flottes, G Di Natale, B Rouzeyre IEEE Design & Test 35 (2), 73-90, 2017 | 37 | 2017 |