Current localisation and redistribution as the basis of discontinuous current controlled negative differential resistance in NbOx SK Nandi, SK Nath, AE Helou, S Li, X Liu, PE Raad, RG Elliman
Advanced Functional Materials (2019), 2019
42 2019 Electric Field- and Current-Induced Electroforming Modes in NbOx SK Nandi, SK Nath, AE El-Helou, S Li, T Ratcliff, M Uenuma, PE Raad, ...
ACS applied materials & interfaces 12 (7), 8422-8428, 2020
29 2020 High-resolution thermoreflectance imaging investigation of self-heating in AlGaN/GaN HEMTs on Si, SiC, and diamond substrates A El Helou, P Komarov, MJ Tadjer, TJ Anderson, DA Francis, T Feygelson, ...
IEEE Transactions on Electron Devices 67 (12), 5415-5420, 2020
28 2020 Characterization of temperature rise in alternating current electrothermal flow using thermoreflectance method A Koklu, A El Helou, PE Raad, A Beskok
Analytical chemistry 91 (19), 12492-12500, 2019
18 2019 Schottky-Barrier-Induced Asymmetry in the Negative-Differential-Resistance Response of SK Nath, SK Nandi, A El-Helou, X Liu, S Li, T Ratcliff, PE Raad, ...
Physical Review Applied 13 (6), 064024, 2020
13 2020 Full thermal characterization of AlGaN/GaN high electron mobility transistors on silicon, silicon carbide, and diamond substrates using a reverse modeling approach A El-Helou, Y Cui, MJ Tadjer, TJ Anderson, D Francis, T Feygelson, ...
Semiconductor Science and Technology 36 (1), 014008, 2020
8 2020 Thermal Conductivity of Amorphous NbOx Thin Films and Its Effect on Volatile Memristive Switching SK Nandi, SK Das, Y Cui, AE Helou, SK Nath, T Ratcliff, P Raad, ...
ACS Applied Materials & Interfaces, 2022
5 2022 Coupled Experimental and Numerical Investigation of High-Voltage GaN HEMTs Y Cui, A El Helou, PE Raad
ECS Transactions 89 (5), 11, 2019
5 2019 Thermal Modeling and Experimental Validation of Heat Sink Design for Passive Cooling of BEOL IC Structures A El Helou, PE Raad, D Kande, A Venugopal
24th InternatIonal Workshop on Thermal Investigations of ICs and Systems …, 2018
5 2018 Temperature dependence of the thermoreflectance coefficient of gold by the use of a phase-locked single-point measurement approach A El Helou, PE Raad, P Komarov
2018 34th Thermal Measurement, Modeling & Management Symposium (SEMI-THERM …, 2018
5 2018 Simple high-performance thermal management of chip-scale GaN FETs JS Glaser, A Helou, M Sharma, R Strittmatter, M de Rooij
2021 IEEE Applied Power Electronics Conference and Exposition (APEC), 44-49, 2021
4 2021 Standardized Heat Spreader Design for Passive Cooling of Interconnects in the BEOL of ICs A El Helou, A Venugopal, PE Raad
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2020
4 2020 Thermal Characterization of Si BEOL Microelectronic Structures A El Helou, PE Raad, A Venugopal, D Kande
ASME 2018 International Technical Conference and Exhibition on Packaging and …, 2018
4 2018 PCB Layout for Chip-Scale Package GaN Fets Optimizes Both Electrical and Thermal Performance J Glaser, A Helou, J Zhu, M de Rooij
Applied Power Electronics Conference (APEC) 2022, 2022
2 2022 Quick Thermal Performance Estimation of Chip Scale Packaged GaN FETs using a Simple Circuit Model A El Helou, J Glaser, M Derooij
2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2021
2 2021 Effects of Thermal Boundary Resistance on the Thermal Performance of GaN HEMT on Diamond A El Helou, M Tadjer, K Hobart, PE Raad
2020 IEEE International Reliability Physics Symposium (IRPS), 1-4, 2020
2 2020 Assessment of CMP fill pattern effect on the thermal performance of interconnects in integrated circuits BEOL A El Helou, A Venugopal, PE Raad
2019 IEEE 69th Electronic Components and Technology Conference (ECTC), 405-409, 2019
2 2019 Full 3D Thermal Simulation of GaN HEMT using Ultra-Fast Self-Adaptive Computations Driven by Experimentally Determined Thermal Maps A El Helou, MJ Tadjer, KD Hobart, PE Raad
24th InternatIonal Workshop on Thermal Investigations of ICs and Systems …, 2018
2 2018 Compact 3D thermal model for VLSI and ULSI interconnect network reliability verification A El Helou, A Venugopal, PE Raad
IEEE Transactions on Device and Materials Reliability 21 (2), 240-251, 2021
1 2021 Current bifurcation induced conducting filament formation in NbOx SK Nandi, SK Nath, A El Helou, S Li, M Uenuma, PE Raad, RG Elliman
arXiv preprint arXiv:1909.06443, 2019
1 2019 
Robert EllimanAustralian National UniversityE-mail megerősítve itt: anu.edu.au
