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Emanuele Valea
Emanuele Valea
Research Engineer, CEA-List
Verified email at cea.fr
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Year
A survey on security threats and countermeasures in IEEE test standards
E Valea, M Da Silva, G Di Natale, ML Flottes, B Rouzeyre
IEEE Design & Test 36 (3), 95-116, 2019
362019
Stream vs block ciphers for scan encryption
E Valea, M Da Silva, ML Flottes, G Di Natale, B Rouzeyre
Microelectronics Journal 86, 65-76, 2019
222019
A new secure stream cipher for scan chain encryption
M Da Silva, E Valea, ML Flottes, S Dupuis, G Di Natale, B Rouzeyre
2018 IEEE 3rd International Verification and Security Workshop (IVSW), 68-73, 2018
202018
Encryption-based secure JTAG
E Valea, M Da Silva, ML Flottes, G Di Natale, B Rouzeyre
2019 IEEE 22nd International Symposium on Design and Diagnostics of …, 2019
162019
Providing confidentiality and integrity in ultra low power iot devices
E Valea, M Da Silva, ML Flottes, G Di Natale, S Dupuis, B Rouzeyre
2019 14th International Conference on Design & Technology of Integrated …, 2019
162019
SI ECCS: SECure context saving for IoT devices
E Valea, M Da Silva, G Di Natale, ML Flottes, S Dupuis, B Rouzeyre
2018 13th international conference on design & technology of integrated …, 2018
152018
Post-quantum cryptography: Challenges and opportunities for robust and secure HW design
D Bellizia, N El Mrabet, AP Fournaris, S Pontié, F Regazzoni, ...
2021 IEEE International Symposium on Defect and fault tolerance in VLSI and …, 2021
112021
Correlation electromagnetic analysis on an FPGA implementation of CRYSTALS-Kyber
RC Rodriguez, F Bruguier, E Valea, P Benoit
2023 18th Conference on Ph. D Research in Microelectronics and Electronics …, 2023
102023
Evaluating data encryption effects on the resilience of an artificial neural network
R Cantoro, NI Deligiannis, MS Reorda, M Traiola, E Valea
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020
102020
A secure scan controller for protecting logic locking
QL Nguyen, E Valea, ML Flottes, S Dupuis, B Rouzeyre
2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020
102020
Towards the integration of reliability and security mechanisms to enhance the fault resilience of neural networks
NI Deligiannis, R Cantoro, MS Reorda, M Traiola, E Valea
IEEE Access 9, 155998-156012, 2021
82021
A Comprehensive Approach to a Trusted Test Infrastructure
M Merandat, V Reynaud, E Valea, J Quevremont, N Valette, P Maistri, ...
2019 IEEE 4th International Verification and Security Workshop (IVSW), 43-48, 2019
72019
On the optimization of SBST test program compaction
R Cantora, E Sanchez, MS Reorda, G Squillero, E Valea
2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2017
62017
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs
F Azaïs, S Bernard, M Comte, B Deveautour, S Dupuis, H El Badawi, ...
2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020
32020
Evaluating the code encryption effects on memory fault resilience
R Cantoro, NI Deligiannis, MS Reorda, M Traiola, E Valea
2020 IEEE Latin-American Test Symposium (LATS), 1-6, 2020
22020
Encryption of test data: which cipher is better?
M Da Silva, E Valea, ML Flottes, S Dupuis, G Di Natale, B Rouzeyre
2018 14th Conference on Ph. D. Research in Microelectronics and Electronics …, 2018
22018
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms
NI Deligiannis, R Cantoro, MS Reorda, M Traiola, E Valea
2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems …, 2022
12022
Flexible and portable management of secure scan implementations exploiting p1687. 1 extensions
M Portolan, E Valea, P Maistri, G Di Natale
IEEE Design & Test 39 (3), 117-124, 2021
12021
IEEE 1838 compliant scan encryption and integrity for 2.5/3D ICs
J Suzano, A Chastand, E Valea, G Di Natale, A Philippe, F Abouzeid, ...
IEEE European Test Symposium, 2024
2024
Compute-In-Place Serial FeRAM: Enhancing Performance, Efficiency and Adaptability in Critical Embedded Systems
JP Noel, E Valea, L Grenouillet, B Chapuis, C Fisher, A Recoquillay, ...
2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration …, 2023
2023
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