| Connecting system identification and robust control for next-generation motion control of a wafer stage T Oomen, R van Herpen, S Quist, M van de Wal, O Bosgra, M Steinbuch IEEE Transactions on Control Systems Technology 22 (1), 102-118, 2013 | 155 | 2013 |
| Rational basis functions in iterative learning control—With experimental verification on a motion system J Bolder, T Oomen IEEE Transactions on Control Systems Technology 23 (2), 722-729, 2014 | 109 | 2014 |
| On inversion-based approaches for feedforward and ILC J van Zundert, T Oomen Mechatronics 50, 282-291, 2018 | 102 | 2018 |
| Advanced motion control for precision mechatronics: Control, identification, and learning of complex systems T Oomen IEEJ Journal of Industry Applications 7 (2), 127-140, 2018 | 85 | 2018 |
| Iterative motion feedforward tuning: A data-driven approach based on instrumental variable identification F Boeren, T Oomen, M Steinbuch Control Engineering Practice 37, 11-19, 2015 | 83 | 2015 |
| Using iterative learning control with basis functions to compensate medium deformation in a wide-format inkjet printer J Bolder, T Oomen, S Koekebakker, M Steinbuch Mechatronics 24 (8), 944-953, 2014 | 74 | 2014 |
| Constrained iterative feedback tuning for robust control of a wafer stage system MF Heertjes, B Van der Velden, T Oomen IEEE transactions on control systems technology 24 (1), 56-66, 2015 | 71 | 2015 |
| Frequency-domain ILC approach for repeating and varying tasks: With application to semiconductor bonding equipment F Boeren, A Bareja, T Kok, T Oomen IEEE/ASME Transactions on Mechatronics 21 (6), 2716-2727, 2016 | 70 | 2016 |
| Optimality and flexibility in iterative learning control for varying tasks J Van Zundert, J Bolder, T Oomen Automatica 67, 295-302, 2016 | 67 | 2016 |
| Joint input shaping and feedforward for point-to-point motion: Automated tuning for an industrial nanopositioning system F Boeren, D Bruijnen, N van Dijk, T Oomen Mechatronics 24 (6), 572-581, 2014 | 65 | 2014 |
| Batch-to-batch rational feedforward control: from iterative learning to identification approaches, with application to a wafer stage L Blanken, F Boeren, D Bruijnen, T Oomen IEEE/ASME Transactions on Mechatronics 22 (2), 826-837, 2016 | 62 | 2016 |
| Iterative Data-DrivenNorm Estimation of Multivariable Systems With Application to Robust Active Vibration Isolation T Oomen, R van der Maas, CR Rojas, H Hjalmarsson IEEE Transactions on Control Systems Technology 22 (6), 2247-2260, 2014 | 55 | 2014 |
| Exploiting additional actuators and sensors for nano-positioning robust motion control R van Herpen, T Oomen, E Kikken, M van de Wal, W Aangenent, ... Mechatronics 24 (6), 619-631, 2014 | 52 | 2014 |
| Resource-efficient ILC for LTI/LTV systems through LQ tracking and stable inversion: Enabling large feedforward tasks on a position-dependent printer J van Zundert, J Bolder, S Koekebakker, T Oomen Mechatronics 38, 76-90, 2016 | 51 | 2016 |
| Sparse iterative learning control with application to a wafer stage: Achieving performance, resource efficiency, and task flexibility T Oomen, CR Rojas Mechatronics 47, 134-147, 2017 | 47 | 2017 |
| Subspace predictive repetitive control to mitigate periodic loads on large scale wind turbines ST Navalkar, JW van Wingerden, E van Solingen, T Oomen, ... Mechatronics 24 (8), 916-925, 2014 | 45 | 2014 |
| System identification for achieving robust performance T Oomen, O Bosgra Automatica 48 (9), 1975-1987, 2012 | 42 | 2012 |
| Inferential motion control: Identification and robust control framework for positioning an unmeasurable point of interest T Oomen, E Grassens, F Hendriks IEEE Transactions on control systems technology 23 (4), 1602-1610, 2014 | 41 | 2014 |
| Suppressing intersample behavior in iterative learning control T Oomen, J Van De Wijdeven, O Bosgra Automatica 45 (4), 981-988, 2009 | 41 | 2009 |
| Analyzing iterations in identification with application to nonparametric H∞-norm estimation CR Rojas, T Oomen, H Hjalmarsson, B Wahlberg Automatica 48 (11), 2776-2790, 2012 | 39 | 2012 |
Maarten SteinbuchEindhoven University of TechnologyVerified email at tue.nl
