Peter Kozma
Peter Kozma
AImotive Ltd, Budapest
Verified email at aimotive.com
TitleCited byYear
Integrated planar optical waveguide interferometer biosensors: a comparative review
P Kozma, F Kehl, E Ehrentreich-Förster, C Stamm, FF Bier
Biosensors and Bioelectronics 58, 287-307, 2014
1832014
Grating coupled optical waveguide interferometer for label-free biosensing
P Kozma, A Hámori, S Kurunczi, K Cottier, R Horvath
Sensors and Actuators B: Chemical 155 (2), 446-450, 2011
572011
Grating coupled interferometry for optical sensing
P Kozma, A Hamori, K Cottier, S Kurunczi, R Horvath
Applied Physics B 97 (1), 5-8, 2009
342009
Nanocrystal characterization by ellipsometry in porous silicon using model dielectric function
P Petrik, M Fried, E Vazsonyi, P Basa, T Lohner, P Kozma, Z Makkai
Journal of Applied Physics 105 (2), 024908, 2009
282009
In-depth characterization and computational 3D reconstruction of flagellar filament protein layer structure based on in situ spectroscopic ellipsometry measurements
P Kozma, D Kozma, A Nemeth, H Jankovics, S Kurunczi, R Horvath, ...
Applied Surface Science 257 (16), 7160-7166, 2011
212011
A novel handheld fluorescent microarray reader for point-of-care diagnostic
P Kozma, A Lehmann, K Wunderlich, D Michel, S Schumacher, ...
Biosensors and Bioelectronics 47, 415-420, 2013
202013
In situ ellipsometric study of surface immobilization of flagellar filaments
S Kurunczi, A Németh, T Hülber, P Kozma, P Petrik, H Jankovics, ...
Applied Surface Science 257 (1), 319-324, 2010
162010
In situ spectroscopic ellipsometry study of protein immobilization on different substrates using liquid cells
A Nemeth, P Kozma, T Hülber, S Kurunczi, R Horvath, P Petrik, ...
Sensor Letters 8 (5), 730-735, 2010
152010
Amplified internal pulsations on a stratified exchange flow excited by interaction between a thin sill and external seiche
M Vincze, P Kozma, B Gyüre, IM Jánosi, K Gábor Szabó, T Tél
Physics of fluids 19 (10), 108108, 2007
142007
Ellipsometric characterization of flagellin films for biosensor applications
P Kozma, N Nagy, S Kurunczi, P Petrik, A Hámori, A Muskotál, ...
physica status solidi c 5 (5), 1427-1430, 2008
132008
Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry
P Petrik, T Gumprecht, A Nutsch, G Roeder, M Lemberger, G Juhasz, ...
Thin Solid Films 541, 131-135, 2013
102013
Optical Models for the Characterization of Silica Nanosphere Monolayers Prepared by the Langmuir− Blodgett Method Using Ellipsometry in the Quasistatic Regime
P Kozma, B Fodor, A Deak, P Petrik
Langmuir 26 (20), 16122-16128, 2010
102010
Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method
B Fodor, P Kozma, S Burger, M Fried, P Petrik
Thin Solid Films 617, 20-24, 2016
92016
Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion and polyelectrolyte deposition on titania nanostructures
J Nador, B Kalas, A Saftics, E Agocs, P Kozma, L Korosi, I Szekacs, ...
Optics express 24 (5), 4812-4823, 2016
82016
Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions
E Agocs, P Kozma, J Nador, A Hamori, M Janosov, B Kalas, S Kurunczi, ...
Applied Surface Science 421, 289-294, 2017
52017
Resolving lateral and vertical structures by ellipsometry using wavelength range scan
P Petrik, E Agócs, J Volk, I Lukacs, B Fodor, P Kozma, T Lohner, S Oh, ...
Thin Solid Films 571, 579-583, 2014
52014
Acoustic wvave propagation modeling on 3D CNN-UM architecture
P Sonkoly, P Kozma, Z Nagy, P Szolgay
2006 10th International Workshop on Cellular Neural Networks and Their …, 2006
52006
Seismic wave propagation modeling on CNN-UM architecture
P Kozma, P Sonkoly, P Szolgay
Functional Differential Equations 13 (1), p. 43-60, 2004
52004
Methods for optical modeling and cross-checking in ellipsometry and scatterometry
P Petrik, B Fodor, E Agócs, P Kozma, J Nádor, N Kumar, J Endres, ...
Modeling Aspects in Optical Metrology V 9526, 95260S, 2015
42015
Multiple angle of incidence, spectroscopic, plasmon-enhanced, internal reflection ellipsometry for the characterization of solid-liquid interface processes
P Petrik, E Agócs, B Kalas, P Kozma, B Fodor, J Nádor, C Major, M Fried
Optical Methods for Inspection, Characterization, and Imaging of …, 2015
32015
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Articles 1–20