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Thomas Lange
Thomas Lange
IROC Technologies
Verified email at iroctech.com
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Cited by
Cited by
Year
Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation
M Glorieux, A Evans, T Lange, AD In, D Alexandrescu, C Boatella-Polo, ...
2018 IEEE Radiation Effects Data Workshop (REDW), 1-5, 2018
242018
Solar particle event and single event upset prediction from SRAM-based monitor and supervised machine learning
J Chen, T Lange, M Andjelkovic, A Simevski, L Lu, M Krstic
IEEE Transactions on Emerging Topics in Computing 10 (2), 564-580, 2022
202022
Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning
J Chen, T Lange, M Andjelkovic, A Simevski, M Krstic
Microelectronics Reliability 114, 113799, 2020
192020
Understanding multidimensional verification: Where functional meets non-functional
X Lai, A Balakrishnan, T Lange, M Jenihhin, T Ghasempouri, J Raik, ...
Microprocessors and microsystems 71, 102867, 2019
192019
A Novel Error Rate Estimation Approach forUltraScale+ SRAM-based FPGAs
L Sterpone, S Azimi, L Bozzoli, B Du, T Lange, M Glorieux, ...
2018 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 120-126, 2018
162018
Composing graph theory and deep neural networks to evaluate seu type soft error effects
A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin
2020 9th Mediterranean Conference on Embedded Computing (MECO), 1-5, 2020
152020
Machine learning to tackle the challenges of transient and soft errors in complex circuits
T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone
2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019
142019
On the estimation of complex circuits functional failure rate by machine learning techniques
T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone
2019 49th Annual IEEE/IFIP International Conference on Dependable Systems …, 2019
132019
Hardware accelerator design with supervised machine learning for solar particle event prediction
J Chen, T Lange, M Andjelkovic, A Simevski, M Krstic
2020 IEEE international symposium on defect and fault tolerance in VLSI and …, 2020
122020
Machine learning clustering techniques for selective mitigation of critical design features
T Lange, A Balakrishnan, M Glorieux, D Alexandrescu, L Sterpone
2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020
112020
Modeling gate-level abstraction hierarchy using graph convolutional neural networks to predict functional de-rating factors
A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin
2019 NASA/ESA Conference on Adaptive Hardware and Systems (AHS), 72-78, 2019
92019
The validation of graph model-based, gate level low-dimensional feature data for machine learning applications
A Balakrishnan, T Lange, M Glorieux, D Alexandrescu, M Jenihhin
2019 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and …, 2019
82019
Functional failure rate due to single-event transients in clock distribution networks
T Lange, M Glorieux, D Alexandrescu, L Sterpone
2019 14th International Conference on Design & Technology of Integrated …, 2019
52019
Single Event Characterization of a Xilinx UltraScale+ MP-SoC FPGA
T Lange, M Glorieux, A Evans, AD In, D Alexandrescu, C Boatella-Polo, ...
2018 ESA/ESTEC Space FPGA Users Workshop (SEFUW’18), 2018
22018
Investigation of the Impact of Angles and Rotation of Low Energy Protons in SRAM Cells Down to 16nm
L Artola, M Glorieux, G Hubert, C Inguimbert, T Bonnoit, R Rey, T Lange, ...
IEEE Transactions on Nuclear Science, 2024
12024
On Antagonism Between Side-Channel Security and Soft-Error Reliability in BNN Inference Engines
X Lai, T Lange, A Balakrishnan, D Alexandrescu, M Jenihhin
2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration …, 2021
12021
Gate-Level Graph Representation Learning: A Step Towards the Improved Stuck-at Faults Analysis
A Balakrishnan, D Alexandrescu, M Jenihhin, T Lange, M Glorieux
2021 22nd International Symposium on Quality Electronic Design (ISQED), 24-30, 2021
12021
Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models
D Alexandrescu, A Balakrishnan, T Lange, M Glorieux
2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020
12020
Methods for Proton Direct Ionization SEU Characterization and Orbital Error Rate Estimation
M Glorieux, T Bonnoit, T Lange, R Gaillard, I Nofal, L Artola, C Poivey, ...
IEEE Transactions on Nuclear Science, 2024
2024
Representing non-crossing cuts by phylogenetic trees
T Lange
Electronic Journal of Graph Theory and Applications (EJGTA) 9 (2), 499-505, 2021
2021
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