Követés
Adam R. Waite
Cím
Hivatkozott rá
Hivatkozott rá
Év
Redox exfoliation of layered transition metal dichalcogenides
A Jawaid, J Che, LF Drummy, J Bultman, A Waite, MS Hsiao, RA Vaia
Acs Nano 11 (1), 635-646, 2017
732017
Large-area synthesis of WSe2 from WO3 by selenium–oxygen ion exchange
P Browning, S Eichfeld, K Zhang, L Hossain, YC Lin, K Wang, N Lu, ...
2D Materials 2 (1), 014003, 2015
442015
Nitrogen and hydrogen plasma treatments of multiwalled carbon nanotubes
JG Jones, AR Waite, C Muratore, AA Voevodin
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2008
242008
Magnetic field argon ion filtering for pulsed magnetron sputtering growth of two-dimensional MoS2
AA Voevodin, AR Waite, JE Bultman, J Hu, C Muratore
Surface and Coatings Technology 280, 260-267, 2015
232015
Impact of reduced graphene oxide on MoS2 grown by sulfurization of sputtered MoO3 and Mo precursor films
S Pacley, J Hu, M Jespersen, A Hilton, A Waite, J Brausch, ...
Journal of Vacuum Science & Technology A 34 (4), 2016
152016
Plasma diagnostics of hybrid magnetron sputtering and pulsed laser deposition
JG Jones, C Muratore, AR Waite, AA Voevodin
Surface and Coatings Technology 201 (7), 4040-4045, 2006
112006
From silicon to simulation: A full decomposition of a fabricated 130 nm serial peripheral interface for establishing an assurance baseline root-of-trust
AG Kimura, AR Waite, J Scholl, J Schaffranek, M Sutter, GD Via
2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-6, 2020
102020
Thermal conductance at nanoscale amorphous boron nitride/metal interfaces
NR Glavin, AR Waite, C Muratore, JE Bultman, J Hu, JJ Gengler, ...
Surface and Coatings Technology 397, 126017, 2020
92020
Tailoring ultra-thin MoS2 films via post-treatment of solid state precursor phases
AR Waite, S Pacley, NR Glavin, AA Voevodin, C Muratore
Thin Solid Films 649, 177-186, 2018
82018
Preparation, imaging, and design extraction of the front-end-of-line and middle-of-line in a 14 nm node finfet device
AR Waite, Y Patel, JJ Kelley, JH Scholl, J Baur, A Kimura, ED Udelhoven, ...
2021 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-6, 2021
52021
IC Decomposition and Imaging Metrics to Optimize Design File Recovery for Verification and Validation
AR Waite, JH Scholl, J Baur, A Kimura, M Strizich, GD Via
ISTFA 2020, 202-208, 2020
52020
Sample mounting methods for precision delayering of 130 nm integrated circuit devices
J Scholl, Y Patel, J Baur, A Kimura, A Waite, J Kelley, GD Via
2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-5, 2020
32020
Applied Failure Analysis Tools and Techniques Toward Integrated Circuit Trust and Assurance
AG Kimura, AR Waite, J Scholl, GD Via
Electronic Device Failure Analysis 23 (1), 7, 2021
22021
Oxygen plasma treatment and deposition of CNx on a fluorinated polymer matrix composite for improved erosion resistance
C Muratore, A Korenyi-Both, JE Bultman, AR Waite, JG Jones, TM Storage, ...
Journal of Vacuum Science & Technology A 25 (4), 843-849, 2007
12007
An Assessment of Sample Preparation Challenges in 3D Stacked Integrated Circuit Devices for Post-Silicon Verification and Validation
N Padro, Y Patel, J Scholl, J Kelley, AR Waite, M Sale, A Kimura
2023 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-7, 2023
2023
Integrated circuit layout extraction using parallelized tile image processing
AR Waite, AG Kimura, JE Schaffranek
US Patent App. 18/121,069, 2023
2023
Effects of Fundamental Processing Parameters on the Structure and Composition of Two-Dimensional MoS2 Films
AR Waite
University of Dayton, 2017
2017
Impact of Reduced Graphene Oxide on MoS2 Grown by Sulfurization of Sputtered MoO3 and Mo Precursor Films (Postprint)
S Pacley, J Brausch, E Beck-Millerton, J Hu, M Jespersen, A Hilton, ...
2016
Optical Dispersion of Amorphous Germanium Thin Films as a Function of Thickness and Deposition Parameters
N Murphy, L Sun, A Waite, J Jones, R Jakubiak
Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box …, 2011
2011
In Situ Spectroscopic Ellipsometric Analysis of Thin Silver Films Deposited Using DC Magnetron Sputtering and HiPIMS Techniques
L Sun, N Murphy, A Waite, J Jones, R Jakubiak
Minerals, Metals and Materials Society/AIME, 420 Commonwealth Dr., P. O. Box …, 2011
2011
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Cikkek 1–20