Follow
David Hély
David Hély
Univ. Grenoble Alpes, Grenoble INP, LCIS
Verified email at lcis.grenoble-inp.fr
Title
Cited by
Cited by
Year
Scan Design and Secure Chip.
D Hély, ML Flottes, F Bancel, B Rouzeyre, N Berard, M Renovell
IOLTS 4, 219-224, 2004
2022004
Test control for secure scan designs
D Hely, F Bancel, ML Flottes, B Rouzeyre
European Test Symposium (ETS'05), 190-195, 2005
1202005
Run-time detection of hardware Trojans: The processor protection unit
J Dubeuf, D Hély, R Karri
2013 18th IEEE European Test Symposium (ETS), 1-6, 2013
572013
Secure scan techniques: a comparison
D Hely, F Bancel, ML Flottes, B Rouzeyre
12th IEEE International On-Line Testing Symposium (IOLTS'06), 6 pp., 2006
562006
Securing scan control in crypto chips
D Hély, F Bancel, ML Flottes, B Rouzeyre
Journal of Electronic Testing 23 (5), 457-464, 2007
542007
Hardware trojan detection using an advised genetic algorithm based logic testing
MA Nourian, M Fazeli, D Hély
Journal of Electronic Testing 34, 461-470, 2018
502018
Laser fault injection at the CMOS 28 nm technology node: an analysis of the fault model
JM Dutertre, V Beroulle, P Candelier, S De Castro, LB Faber, ML Flottes, ...
2018 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC), 1-6, 2018
492018
Key reconciliation protocols for error correction of silicon PUF responses
B Colombier, L Bossuet, V Fischer, D Hély
IEEE Transactions on Information Forensics and Security 12 (8), 1988-2002, 2017
412017
Voltage glitch attacks on mixed-signal systems
N Beringuier-Boher, K Gomina, D Hely, JB Rigaud, V Beroulle, A Tria, ...
2014 17th Euromicro Conference on Digital System Design, 379-386, 2014
382014
A multiple fault injection methodology based on cone partitioning towards RTL modeling of laser attacks
A Papadimitriou, D Hély, V Beroulle, P Maistri, R Leveugle
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014
342014
Hardware security evaluation platform for MCU-based connected devices: application to healthcare IoT
Z Kazemi, A Papadimitriou, D Hely, M Fazcli, V Beroulle
2018 IEEE 3rd International Verification and Security Workshop (IVSW), 87-92, 2018
332018
RFID System On-line Testing based on the evaluation of the Tags Read-Error-Rate
G Fritz, V Beroulle, OEK Aktouf, MD Nguyen, D Hély
Journal of Electronic Testing 27, 267-276, 2011
262011
On the performance of non-profiled differential deep learning attacks against an AES encryption algorithm protected using a correlated noise generation based hiding countermeasure
A Alipour, A Papadimitriou, V Beroulle, E Aerabi, D Hély
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 614-617, 2020
242020
Authentication using metallic inkjet-printed chipless RFID tags
Z Ali, E Perret, N Barbot, R Siragusa, D Hely, M Bernier, F Garet
IEEE Transactions on Antennas and Propagation 68 (5), 4137-4142, 2019
242019
A secure scan design methodology
D Hely, F Bancel, ML Flottes, B Rouzeyre
Proceedings of the Design Automation & Test in Europe Conference 1, 1-2, 2006
222006
Hardware security vulnerability assessment to identify the potential risks in a critical embedded application
Z Kazemi, M Fazeli, D Hely, V Beroulle
2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020
212020
On a low cost fault injection framework for security assessment of cyber-physical systems: Clock glitch attacks
Z Kazemi, A Papadimitriou, I Souvatzoglou, E Aerabi, MM Ahmed, D Hely, ...
2019 IEEE 4th International Verification and Security Workshop (IVSW), 7-12, 2019
212019
Laser-induced fault effects in security-dedicated circuits
R Leveugle, P Maistri, P Vanhauwaert, F Lu, G Di Natale, ML Flottes, ...
2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC …, 2014
212014
SALWARE: Salutary Hardware to design Trusted IC.
L Bossuet, D Hely
Workshop on Trustworthy Manufacturing and Utilization of Secure Devices …, 2013
202013
PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community
AA Pour, V Beroulle, B Cambou, JL Danger, G Di Natale, D Hely, ...
2020 IEEE European Test Symposium (ETS), 1-10, 2020
192020
The system can't perform the operation now. Try again later.
Articles 1–20