Követés
Vipin N. Tondare
Vipin N. Tondare
E-mail megerősítve itt: nist.gov
Cím
Hivatkozott rá
Hivatkozott rá
Év
Field emission from open ended aluminum nitride nanotubes
VN Tondare, C Balasubramanian, SV Shende, DS Joag, VP Godbole, ...
Applied Physics Letters 80 (25), 4813-4815, 2002
3192002
Quest for high brightness, monochromatic noble gas ion sources
VN Tondare
Journal of Vacuum Science & Technology A 23 (6), 1498-1508, 2005
1662005
Comparative study of multiwall carbon nanotube nanocomposites by Raman, SEM, and XPS measurement techniques
Y Piao, VN Tondare, CS Davis, JM Gorham, EJ Petersen, JW Gilman, ...
Composites Science and Technology 208, 108753, 2021
562021
Field emission from carbon nanotubes grown on a tungsten tip
RB Sharma, VN Tondare, DS Joag, A Govindaraj, CNR Rao
Chemical physics letters 344 (3-4), 283-286, 2001
552001
Self-assembled Ge nanostructures as field emitters
VN Tondare, BI Birajdar, N Pradeep, DS Joag, A Lobo, SK Kulkarni
Applied Physics Letters 77 (15), 2394-2396, 2000
402000
The effects of particle size distribution on the rheological properties of the powder and the mechanical properties of additively manufactured 17-4 PH stainless steel
JS Weaver, J Whiting, V Tondare, C Beauchamp, M Peltz, J Tarr, TQ Phan, ...
Additive manufacturing 39, 101851, 2021
392021
A comparison of particle size distribution and morphology data acquired using lab-based and commercially available techniques: Application to stainless steel powder
JG Whiting, EJ Garboczi, VN Tondare, JHJ Scott, MA Donmez, SP Moylan
Powder Technology 396, 648-662, 2022
212022
Field emission studies of CVD diamond thin films: effect of acid treatment
PM Koinkar, PP Patil, MA More, VN Tondare, DS Joag
Vacuum 72 (3), 321-326, 2003
202003
Stability of field emission current from porous n-GaAs(110)
VN Tondare, M Naddaf, AB Bhise, SV Bhoraskar, DS Joag, AB Mandale, ...
Applied physics letters 80 (6), 1085-1087, 2002
202002
Three-dimensional (3d) nanometrology based on scanning electron microscope (SEM) stereophotogrammetry
VN Tondare, JS Villarrubia, AE Vladár
Microscopy and Microanalysis 23 (5), 967-977, 2017
172017
Stable field emission from W tips in poor vacuum conditions
VN Tondare, NJ van Druten, CW Hagen, P Kruit
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2003
162003
Field emission from diamond coated tungsten tips
VN Tondare, N Pradeep, DD Bambaladi, VP Godbole, DS Joag
Solid-State Electronics 45 (6), 957-962, 2001
162001
Uncertainty of particle size measurements using dynamic image analysis
JG Whiting, VN Tondare, JHJ Scott, TQ Phan, MA Donmez
CIRP Annals 68 (1), 531-534, 2019
152019
A method to determine the number of nanoparticles in a cluster using conventional optical microscopes
H Kang, R Attota, V Tondare, AE Vladár, P Kavuri
Applied Physics Letters 107 (10), 2015
122015
Particle-optical apparatus equipped with a gas ion source
P Kruit, VN Tondare
US Patent 7,772,564, 2010
122010
Virtual rough samples to test 3D nanometer-scale scanning electron microscopy stereo photogrammetry
JS Villarrubia, VN Tondare, AE Vladár
Metrology, Inspection, and Process Control for Microlithography XXX 9778, 80-88, 2016
92016
Towards a high brightness, monochromatic electron impact gas ion source
VN Tondare
82006
An electron microscopy investigation of the structure of porous silicon by oxide replication
VN Tondare, BC Gierhart, DG Howitt, RL Smith, SJ Chen, SD Collins
Nanotechnology 19 (22), 225301, 2008
52008
Field electron emission from CdTe deposited tungsten tip: light-induced effects
RB Sharma, RA Singh, GC Dubey, VN Tondare, N Pradeep, DS Joag
Materials Science and Engineering: A 353 (1-2), 52-55, 2003
42003
A Concept for Three-Dimensional Particle Metrology Based on Scanning Electron Microscopy and Structure-from-Motion Photogrammetry
VN Tondare
Journal of Research of the National Institute of Standards and Technology 125, 2020
32020
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Cikkek 1–20